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Article: New defect spectroscopies

TitleNew defect spectroscopies
Authors
KeywordsACAR
Coincidence Doppler broadening spectroscopy
Deconvolution
Deep-level transient spectroscopy
Doppler broadening spectroscopy
Positron deep-level transient spectroscopy
Issue Date2002
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsusc
Citation
Applied Surface Science, 2002, v. 194 n. 1-4, p. 224-233 How to Cite?
AbstractThis paper will review progress being made on developing more defect selective forms of positron annihilation spectroscopy (PAS) at the University of Hong Kong. The first of these, positron deep-level transient spectroscopy (PDLTS), parallels conventional deep-level transient spectroscopy (DLTS) except that the positron is used as the probe, either to tell if the defects have vacancies attached to their microstructure (type I PDLTS) or as a simple electric field probe (type II PDLTS). It is shown the more important type I PDLTS has an intrinsic problem brought about by the high donor densities required to operate electrical trap filling. The problem - namely fast positron drift out of the active deep-level region into the reverse biased junction - is suggested as having two solutions. The first is to move to higher positron beam intensities and take spectra of 109 events. The second is that by using lower dopant densities (<1015cm-3) deep levels may be filled by inter-band optical excitation thus forming the workable technique positron optical (PO)-DLTS. Other techniques briefly considered in this paper are deconvoluted-coincidence Doppler broadening spectroscopy (CDBS) and Fourier transform (FT)-CDBS. Such are seen from a different perspective than most contemporary works, which tend to concentrate on the high momentum region. It is pointed out that the additional root-of-two improvement in hardware resolution and the factor of three improvement gained through deconvolution, can produce final effective resolutions similar to ACAR. Moreover, since in deconvolution, the natural space for regularized solutions is "real crystal space" - it is suggested that the autocorrelation function B2γ(r) be taken as the experimental CDBS data - not just because it provides easier visualization, - but because data in this form lies directly on the crystal lattice. © 2002 Elsevier Science B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/80770
ISSN
2015 Impact Factor: 3.15
2015 SCImago Journal Rankings: 0.930
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorBeling, CDen_HK
dc.date.accessioned2010-09-06T08:10:05Z-
dc.date.available2010-09-06T08:10:05Z-
dc.date.issued2002en_HK
dc.identifier.citationApplied Surface Science, 2002, v. 194 n. 1-4, p. 224-233en_HK
dc.identifier.issn0169-4332en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80770-
dc.description.abstractThis paper will review progress being made on developing more defect selective forms of positron annihilation spectroscopy (PAS) at the University of Hong Kong. The first of these, positron deep-level transient spectroscopy (PDLTS), parallels conventional deep-level transient spectroscopy (DLTS) except that the positron is used as the probe, either to tell if the defects have vacancies attached to their microstructure (type I PDLTS) or as a simple electric field probe (type II PDLTS). It is shown the more important type I PDLTS has an intrinsic problem brought about by the high donor densities required to operate electrical trap filling. The problem - namely fast positron drift out of the active deep-level region into the reverse biased junction - is suggested as having two solutions. The first is to move to higher positron beam intensities and take spectra of 109 events. The second is that by using lower dopant densities (<1015cm-3) deep levels may be filled by inter-band optical excitation thus forming the workable technique positron optical (PO)-DLTS. Other techniques briefly considered in this paper are deconvoluted-coincidence Doppler broadening spectroscopy (CDBS) and Fourier transform (FT)-CDBS. Such are seen from a different perspective than most contemporary works, which tend to concentrate on the high momentum region. It is pointed out that the additional root-of-two improvement in hardware resolution and the factor of three improvement gained through deconvolution, can produce final effective resolutions similar to ACAR. Moreover, since in deconvolution, the natural space for regularized solutions is "real crystal space" - it is suggested that the autocorrelation function B2γ(r) be taken as the experimental CDBS data - not just because it provides easier visualization, - but because data in this form lies directly on the crystal lattice. © 2002 Elsevier Science B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsuscen_HK
dc.relation.ispartofApplied Surface Scienceen_HK
dc.rightsApplied Surface Science. Copyright © Elsevier BV.en_HK
dc.subjectACARen_HK
dc.subjectCoincidence Doppler broadening spectroscopyen_HK
dc.subjectDeconvolutionen_HK
dc.subjectDeep-level transient spectroscopyen_HK
dc.subjectDoppler broadening spectroscopyen_HK
dc.subjectPositron deep-level transient spectroscopyen_HK
dc.titleNew defect spectroscopiesen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0169-4332&volume=194&spage=224&epage=233&date=2002&atitle=New+defect+spectroscopiesen_HK
dc.identifier.emailBeling, CD: cdbeling@hkucc.hku.hken_HK
dc.identifier.authorityBeling, CD=rp00660en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0169-4332(02)00109-5en_HK
dc.identifier.scopuseid_2-s2.0-0037150970en_HK
dc.identifier.hkuros67401en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0037150970&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume194en_HK
dc.identifier.issue1-4en_HK
dc.identifier.spage224en_HK
dc.identifier.epage233en_HK
dc.identifier.isiWOS:000177499200043-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridBeling, CD=7005864180en_HK

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