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Article: Direct measurement of attachment of 220Rn progeny on aerosols by atomic force microscopy

TitleDirect measurement of attachment of 220Rn progeny on aerosols by atomic force microscopy
Authors
KeywordsAerosol attachment
Atomic force microscopy
CR-39
Radon and thoron progeny
Issue Date2003
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nima
Citation
Nuclear Instruments And Methods In Physics Research, Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, 2003, v. 508 n. 3, p. 512-518 How to Cite?
AbstractAtomic force microscopy (AFM) is becoming a powerful tool for the study of nuclear tracks in materials such as CR-39. Coupled with its capability of observing near nm aerosol particles, we have utilized the AFM to observe the radon progeny-loaded aerosol particles deposited on surfaces of CR-39 and to observe the corresponding etch pits produced by the α-particles emitted from the radon progenies. A special platform was built so that after the aerosol particles on the CR-39 have been scanned and recorded, the CR-39 can be etched and then scanned for the etch pits at the same location. Both 222Rn and 220Rn progenies were used in the study. The progenies were generated by the appropriate radon sources and mixed with aerosol particles generated by aerosol generators. The aerosol size distributions were analyzed by a scanning mobility particle sizer. Some of the limitations and difficulties of the technique will be described. The results enable us to examine the attachment process including multiple attachments of radon progenies on aerosols. © 2003 Elsevier Science B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/80623
ISSN
2015 Impact Factor: 1.2
2015 SCImago Journal Rankings: 0.980
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLeung, JKCen_HK
dc.contributor.authorTso, MYWen_HK
dc.contributor.authorLam, JHCen_HK
dc.contributor.authorZhau, QFen_HK
dc.date.accessioned2010-09-06T08:08:29Z-
dc.date.available2010-09-06T08:08:29Z-
dc.date.issued2003en_HK
dc.identifier.citationNuclear Instruments And Methods In Physics Research, Section A: Accelerators, Spectrometers, Detectors And Associated Equipment, 2003, v. 508 n. 3, p. 512-518en_HK
dc.identifier.issn0168-9002en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80623-
dc.description.abstractAtomic force microscopy (AFM) is becoming a powerful tool for the study of nuclear tracks in materials such as CR-39. Coupled with its capability of observing near nm aerosol particles, we have utilized the AFM to observe the radon progeny-loaded aerosol particles deposited on surfaces of CR-39 and to observe the corresponding etch pits produced by the α-particles emitted from the radon progenies. A special platform was built so that after the aerosol particles on the CR-39 have been scanned and recorded, the CR-39 can be etched and then scanned for the etch pits at the same location. Both 222Rn and 220Rn progenies were used in the study. The progenies were generated by the appropriate radon sources and mixed with aerosol particles generated by aerosol generators. The aerosol size distributions were analyzed by a scanning mobility particle sizer. Some of the limitations and difficulties of the technique will be described. The results enable us to examine the attachment process including multiple attachments of radon progenies on aerosols. © 2003 Elsevier Science B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimaen_HK
dc.relation.ispartofNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipmenten_HK
dc.rightsNuclear Instruments & Methods in Physics Research Section A Accelerators, Spectrometers, Detectors, and Associated Equipment. Copyright © Elsevier BV.en_HK
dc.subjectAerosol attachmenten_HK
dc.subjectAtomic force microscopyen_HK
dc.subjectCR-39en_HK
dc.subjectRadon and thoron progenyen_HK
dc.titleDirect measurement of attachment of 220Rn progeny on aerosols by atomic force microscopyen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0168-9002&volume=508&spage=512&epage=518&date=2003&atitle=Direct+measurement+of+attachment+of+220Rn+progeny+on+aerosols+by+atomic+force+microscopyen_HK
dc.identifier.emailLeung, JKC: jkcleung@hku.hken_HK
dc.identifier.authorityLeung, JKC=rp00732en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0168-9002(03)01473-6en_HK
dc.identifier.scopuseid_2-s2.0-0041743943en_HK
dc.identifier.hkuros88412en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0041743943&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume508en_HK
dc.identifier.issue3en_HK
dc.identifier.spage512en_HK
dc.identifier.epage518en_HK
dc.identifier.isiWOS:000184660500033-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridLeung, JKC=24080627200en_HK
dc.identifier.scopusauthoridTso, MYW=7102052118en_HK
dc.identifier.scopusauthoridLam, JHC=16020806900en_HK
dc.identifier.scopusauthoridZhau, QF=6504220907en_HK

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