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- Publisher Website: 10.1088/0953-8984/14/6/310
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Article: Direct inversion of low-energy electron diffraction (LEED) IV spectra: The surface Patterson function
Title | Direct inversion of low-energy electron diffraction (LEED) IV spectra: The surface Patterson function |
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Authors | |
Issue Date | 2002 |
Publisher | Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcm |
Citation | Journal Of Physics Condensed Matter, 2002, v. 14 n. 6, p. 1231-1236 How to Cite? |
Abstract | The symmetrized data acquisition method for producing artifact-free Patterson functions from low-energy electron diffraction (LEED) IV spectra was analyzed. The far-field approximation was used to write the diffracted intensities of PFs. The non-straight-through multiple-scattering events were found to cause the artifacts in the LEED PFs. Analysis showed that full beam sets at multiple incidence angles were necessary for the recovery of an artifact-free PF in the presence of multiple scattering. |
Persistent Identifier | http://hdl.handle.net/10722/80606 |
ISSN | 2023 Impact Factor: 2.3 2023 SCImago Journal Rankings: 0.676 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Tong, SY | en_HK |
dc.contributor.author | Wu, H | en_HK |
dc.date.accessioned | 2010-09-06T08:08:18Z | - |
dc.date.available | 2010-09-06T08:08:18Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | Journal Of Physics Condensed Matter, 2002, v. 14 n. 6, p. 1231-1236 | en_HK |
dc.identifier.issn | 0953-8984 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/80606 | - |
dc.description.abstract | The symmetrized data acquisition method for producing artifact-free Patterson functions from low-energy electron diffraction (LEED) IV spectra was analyzed. The far-field approximation was used to write the diffracted intensities of PFs. The non-straight-through multiple-scattering events were found to cause the artifacts in the LEED PFs. Analysis showed that full beam sets at multiple incidence angles were necessary for the recovery of an artifact-free PF in the presence of multiple scattering. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcm | en_HK |
dc.relation.ispartof | Journal of Physics Condensed Matter | en_HK |
dc.title | Direct inversion of low-energy electron diffraction (LEED) IV spectra: The surface Patterson function | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0953-8984&volume=14&spage=1231&epage=1236&date=2002&atitle=Direct+inversion+of+low-energy+electron+diffraction+(LEED)+IV+spectra:+the+surface+Patterson+function | en_HK |
dc.identifier.email | Wu, H: hswu@hkucc.hku.hk | en_HK |
dc.identifier.authority | Wu, H=rp00813 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1088/0953-8984/14/6/310 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0037127632 | en_HK |
dc.identifier.hkuros | 77067 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0037127632&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 14 | en_HK |
dc.identifier.issue | 6 | en_HK |
dc.identifier.spage | 1231 | en_HK |
dc.identifier.epage | 1236 | en_HK |
dc.identifier.isi | WOS:000174332000017 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Tong, SY=24512624800 | en_HK |
dc.identifier.scopusauthorid | Wu, H=7405584367 | en_HK |
dc.identifier.issnl | 0953-8984 | - |