Article: Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

File Download Links for fulltext
(May Require Subscription)
Supplementary
  • Basic View
  • Metadata View
  • XML View
TitleLight-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
AuthorsLiu, Z2
Chen, TP2
Liu, Y2
Ding, L2
Yang, M2
Wong, JI2
Cen, ZH2
Li, YB2
Zhang, S2
Fung, S1
KeywordsAluminum compounds
Charge trapping
Electric conductance
Magnetron sputtering
Nanocrystals
Issue Date2008
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
CitationApplied Physics Letters, 2008, v. 92 n. 1 [How to Cite?]
DOI: http://dx.doi.org/10.1063/1.2828691
AbstractAl nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. © 2008 American Institute of Physics.
ISSN0003-6951
2011 Impact Factor: 3.844
2011 SCImago Journal Rankings: 0.398
DOIhttp://dx.doi.org/10.1063/1.2828691
ISI Accession Number IDWOS:000252284200132
ReferencesReferences in Scopus
DC Field
Value
dc.contributor.authorLiu, Z
dc.contributor.authorChen, TP
dc.contributor.authorLiu, Y
dc.contributor.authorDing, L
dc.contributor.authorYang, M
dc.contributor.authorWong, JI
dc.contributor.authorCen, ZH
dc.contributor.authorLi, YB
dc.contributor.authorZhang, S
dc.contributor.authorFung, S
dc.date.accessioned2010-09-06T08:07:46Z
dc.date.available2010-09-06T08:07:46Z
dc.date.issued2008
dc.description.abstractAl nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. © 2008 American Institute of Physics.
dc.description.naturepublished_or_final_version
dc.identifier.citationApplied Physics Letters, 2008, v. 92 n. 1 [How to Cite?]
DOI: http://dx.doi.org/10.1063/1.2828691
dc.identifier.doihttp://dx.doi.org/10.1063/1.2828691
dc.identifier.hkuros140636
dc.identifier.isiWOS:000252284200132
dc.identifier.issn0003-6951
2011 Impact Factor: 3.844
2011 SCImago Journal Rankings: 0.398
dc.identifier.issue1
dc.identifier.scopuseid_2-s2.0-38049010867
dc.identifier.urihttp://hdl.handle.net/10722/80558
dc.identifier.volume92
dc.languageeng
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
dc.publisher.placeUnited States
dc.relation.ispartofApplied Physics Letters
dc.relation.referencesReferences in Scopus
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
dc.rightsCopyright (2008) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in (Applied Physics Letters, 2008, v. 92 n. 1, article no. 013102) and may be found at (http://apl.aip.org/resource/1/applab/v92/i1/p013102_s1).
dc.subjectAluminum compounds
dc.subjectCharge trapping
dc.subjectElectric conductance
dc.subjectMagnetron sputtering
dc.subjectNanocrystals
dc.titleLight-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
dc.typeArticle
Author Affiliations
  1. The University of Hong Kong
  2. Nanyang Technological University