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Article: GaN nanowires: CVD synthesis and properties
Title | GaN nanowires: CVD synthesis and properties |
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Authors | |
Keywords | Gallium nitride Nanostructures |
Issue Date | 2006 |
Publisher | Elsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsf |
Citation | Thin Solid Films, 2006, v. 515 n. 3, p. 984-989 How to Cite? |
Abstract | The growth of GaN nanowires from Ga and NH 3 sources in the flow of Ar carrier gas using a chemical vapor deposition (CVD) system was systematically studied. The substrates used were Si(111) and Si(100). Fabricated nanowires were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDX). We investigated the influence of growth temperature, catalyst used, Ga amount, and the ratio of Ar and NH 3 flow rates on the morphology and properties of GaN nanowires. We found that the best results were obtained for a growth temperature of 950 °C. Optimal catalysts were Au and metallic Ni, while the use of nickel nitrate was found to lead to formation of SiO x nanowire bunches in addition to GaN nanowires. For the optimal temperature and catalyst used, the influence of the Ga to N ratio on the nanowire growth was studied. It was found that different types of nanostructures are observed in relatively Ga-rich and in relatively N-rich conditions. Growth mechanisms of different types of nanowires, including the stacked-cone nanowires and the microscale structures formed by lateral growth under N-rich conditions, are discussed. © 2006 Elsevier B.V. All rights reserved. |
Persistent Identifier | http://hdl.handle.net/10722/80404 |
ISSN | 2023 Impact Factor: 2.0 2023 SCImago Journal Rankings: 0.400 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Cai, XM | en_HK |
dc.contributor.author | Djurišić, AB | en_HK |
dc.contributor.author | Xie, MH | en_HK |
dc.date.accessioned | 2010-09-06T08:06:05Z | - |
dc.date.available | 2010-09-06T08:06:05Z | - |
dc.date.issued | 2006 | en_HK |
dc.identifier.citation | Thin Solid Films, 2006, v. 515 n. 3, p. 984-989 | en_HK |
dc.identifier.issn | 0040-6090 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/80404 | - |
dc.description.abstract | The growth of GaN nanowires from Ga and NH 3 sources in the flow of Ar carrier gas using a chemical vapor deposition (CVD) system was systematically studied. The substrates used were Si(111) and Si(100). Fabricated nanowires were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDX). We investigated the influence of growth temperature, catalyst used, Ga amount, and the ratio of Ar and NH 3 flow rates on the morphology and properties of GaN nanowires. We found that the best results were obtained for a growth temperature of 950 °C. Optimal catalysts were Au and metallic Ni, while the use of nickel nitrate was found to lead to formation of SiO x nanowire bunches in addition to GaN nanowires. For the optimal temperature and catalyst used, the influence of the Ga to N ratio on the nanowire growth was studied. It was found that different types of nanostructures are observed in relatively Ga-rich and in relatively N-rich conditions. Growth mechanisms of different types of nanowires, including the stacked-cone nanowires and the microscale structures formed by lateral growth under N-rich conditions, are discussed. © 2006 Elsevier B.V. All rights reserved. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Elsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsf | en_HK |
dc.relation.ispartof | Thin Solid Films | en_HK |
dc.subject | Gallium nitride | en_HK |
dc.subject | Nanostructures | en_HK |
dc.title | GaN nanowires: CVD synthesis and properties | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0040-6090&volume=515&spage=984&epage=989&date=2006&atitle=GaN+nanowires:+CVD+synthesis+and+properties | en_HK |
dc.identifier.email | Djurišić, AB: dalek@hku.hk | en_HK |
dc.identifier.email | Xie, MH: mhxie@hku.hk | en_HK |
dc.identifier.authority | Djurišić, AB=rp00690 | en_HK |
dc.identifier.authority | Xie, MH=rp00818 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/j.tsf.2006.07.085 | en_HK |
dc.identifier.scopus | eid_2-s2.0-33750475945 | en_HK |
dc.identifier.hkuros | 124814 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-33750475945&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 515 | en_HK |
dc.identifier.issue | 3 | en_HK |
dc.identifier.spage | 984 | en_HK |
dc.identifier.epage | 989 | en_HK |
dc.identifier.isi | WOS:000242639600028 | - |
dc.publisher.place | Switzerland | en_HK |
dc.identifier.scopusauthorid | Cai, XM=8923610200 | en_HK |
dc.identifier.scopusauthorid | Djurišić, AB=7004904830 | en_HK |
dc.identifier.scopusauthorid | Xie, MH=7202255416 | en_HK |
dc.identifier.issnl | 0040-6090 | - |