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Article: Studies on strain relaxation and in-plane orientation of La0.7Ca0.3MnO3 film by grazing incidence X-ray diffraction

TitleStudies on strain relaxation and in-plane orientation of La0.7Ca0.3MnO3 film by grazing incidence X-ray diffraction
Authors
KeywordsLa0.7Ca0.3MnO3 film
Grazing incidence X-ray diffraction
Strain relaxation
In-plane growth orientation
Issue Date2010
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jallcom
Citation
Journal of Alloys and Compounds, 2010, v. 491 n. 1-2, p. 545-549 How to Cite?
AbstractPerovskite manganite La0.7Ca0.3MnO3 (LCMO) films were deposited on (0 0 1)-oriented single crystal MgO and SrTiO3 (STO) substrates by 90° off-axis radio frequency magnetron sputtering. The thickness of LCMO/STO film was 50 nm. The thickness of LCMO/MgO films ranged from 5 nm to 200 nm. LCMO films were well (0 0 1)-oriented grown with high crystalline quality. Grazing incidence X-ray diffraction technique and normal X-ray diffraction were applied to characterize the in-plane and out-of-plane lattice strains and strain relaxation. The in-plane growth orientations of LCMO films with respect to substrate surface were also studied. The results indicated that the lattice strain of LCMO films began to relax when the film thickness is less than 5 nm. The mechanism for strain relaxation in LCMO films is perhaps different from that for tetragonal distortion. The in-plane growth orientation of LCMO/MgO film studied by grazing incidence X-ray diffraction technique is consistent with that from transmission electron microscopy.
Persistent Identifierhttp://hdl.handle.net/10722/80397
ISSN
2015 Impact Factor: 3.014
2015 SCImago Journal Rankings: 1.006
ISI Accession Number ID
Funding AgencyGrant Number
Natural Science Foundation of Jiangsu ProvinceBK2006204
Scientific Developing FoundationAb96249
Young Scholar Foundation of Nanjing University of Science and TechnologyNjust200403
Research Grant Council (RGC) of Hong KongHKU 7024/07P
Funding Information:

This work was partially supported by Natural Science Foundation of Jiangsu Province (No. BK2006204), Scientific Developing Foundation (No. Ab96249) and Young Scholar Foundation (No. Njust200403) of Nanjing University of Science and Technology. One of the authors (Tan) would like to thank the support of Opening Project from National Key Laboratory of Solid State Microstructures at Nanjing University. The work done in the University of Hong Kong has been supported by the Research Grant Council (RGC) of Hong Kong (project number: HKU 7024/07P).

 

DC FieldValueLanguage
dc.contributor.authorTan, WSen_HK
dc.contributor.authorWu, HPen_HK
dc.contributor.authorDeng, KMen_HK
dc.contributor.authorWu, XSen_HK
dc.contributor.authorJia, QJen_HK
dc.contributor.authorGao, Jen_HK
dc.date.accessioned2010-09-06T08:06:00Z-
dc.date.available2010-09-06T08:06:00Z-
dc.date.issued2010en_HK
dc.identifier.citationJournal of Alloys and Compounds, 2010, v. 491 n. 1-2, p. 545-549en_HK
dc.identifier.issn0925-8388en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80397-
dc.description.abstractPerovskite manganite La0.7Ca0.3MnO3 (LCMO) films were deposited on (0 0 1)-oriented single crystal MgO and SrTiO3 (STO) substrates by 90° off-axis radio frequency magnetron sputtering. The thickness of LCMO/STO film was 50 nm. The thickness of LCMO/MgO films ranged from 5 nm to 200 nm. LCMO films were well (0 0 1)-oriented grown with high crystalline quality. Grazing incidence X-ray diffraction technique and normal X-ray diffraction were applied to characterize the in-plane and out-of-plane lattice strains and strain relaxation. The in-plane growth orientations of LCMO films with respect to substrate surface were also studied. The results indicated that the lattice strain of LCMO films began to relax when the film thickness is less than 5 nm. The mechanism for strain relaxation in LCMO films is perhaps different from that for tetragonal distortion. The in-plane growth orientation of LCMO/MgO film studied by grazing incidence X-ray diffraction technique is consistent with that from transmission electron microscopy.-
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jallcomen_HK
dc.relation.ispartofJournal of Alloys and Compoundsen_HK
dc.subjectLa0.7Ca0.3MnO3 film-
dc.subjectGrazing incidence X-ray diffraction-
dc.subjectStrain relaxation-
dc.subjectIn-plane growth orientation-
dc.titleStudies on strain relaxation and in-plane orientation of La0.7Ca0.3MnO3 film by grazing incidence X-ray diffractionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0925-8388&volume=491&issue=1-2&spage=545&epage=549&date=2010&atitle=Studies+on+strain+relaxation+and+in-plane+orientation+of+La0.7Ca0.3MnO3+film+by+grazing+incidence+X-ray+diffractionen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.authorityGao, J=rp00699en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.jallcom.2009.10.264-
dc.identifier.scopuseid_2-s2.0-74449093298-
dc.identifier.hkuros169488en_HK
dc.identifier.volume491-
dc.identifier.issue1-2-
dc.identifier.spage545-
dc.identifier.epage549-
dc.identifier.isiWOS:000274926300113-

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