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Article: Structural Strain in a-Axis Oriented YBa2Cu3O7-δ Thin Films Studied by Electron Backscatter Diffraction

TitleStructural Strain in a-Axis Oriented YBa2Cu3O7-δ Thin Films Studied by Electron Backscatter Diffraction
Authors
Issue Date1998
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/sust
Citation
Superconductor Science & Technology, 1998, v. 11 n. 3, p. 278-283 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/80372
ISSN
2023 Impact Factor: 3.7
2023 SCImago Journal Rankings: 1.056
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorGao, Jen_HK
dc.contributor.authorCheng, TLen_HK
dc.date.accessioned2010-09-06T08:05:44Z-
dc.date.available2010-09-06T08:05:44Z-
dc.date.issued1998en_HK
dc.identifier.citationSuperconductor Science & Technology, 1998, v. 11 n. 3, p. 278-283en_HK
dc.identifier.issn0953-2048en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80372-
dc.languageengen_HK
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/susten_HK
dc.relation.ispartofSuperconductor Science & Technologyen_HK
dc.titleStructural Strain in a-Axis Oriented YBa2Cu3O7-δ Thin Films Studied by Electron Backscatter Diffractionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0953-2048&volume=11&spage=278&epage=283&date=1998&atitle=Structural+Strain+in+a-Axis+Oriented+YBa2Cu3O7-!d+Thin+Films+Studied+by+Electron+Backscatter+Diffractionen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.authorityGao, J=rp00699en_HK
dc.identifier.doi10.1088/0953-2048/11/3/005-
dc.identifier.scopuseid_2-s2.0-0032024217-
dc.identifier.hkuros31129en_HK
dc.identifier.isiWOS:000072541900005-
dc.identifier.issnl0953-2048-

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