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Article: Analysis of a bi-piezoelectric ceramic layer with an interfacial crack subjected to anti-plane shear and in-plane electric loading

TitleAnalysis of a bi-piezoelectric ceramic layer with an interfacial crack subjected to anti-plane shear and in-plane electric loading
Authors
Issue Date2000
PublisherElsevier France, Editions Scientifiques et Medicales. The Journal's web site is located at http://www.elsevier.com/locate/ejmsol
Citation
European Journal Of Mechanics A - Solids, 2000, v. 19 n. 6, p. 961-977 How to Cite?
AbstractThe behaviour of a bi-piezoelectric ceramic layer with a centre interfacial crack subjected to anti-plane shear and in-plane electric loading has been studied. The dislocation density functions and the Fourier integral transform method have been employed to eliminate the problem of singular integral equations. The normalized energy release rate, stress and electrical displacement intensity factors, G/G0, KIII/KIII0 and KD/KD0, respectively, were determined for different geometric and property parameters by use of two different crack surface electric boundary conditions, i.e. impermeable and permeable. It has been shown that the effects of the thickness and material constants of the piezoelectric layer on all the three parameters, i.e. G/G0, KIII/KIII0 and KD/KD0 were significant.
Persistent Identifierhttp://hdl.handle.net/10722/76207
ISSN
2015 Impact Factor: 2.453
2015 SCImago Journal Rankings: 1.536
References

 

DC FieldValueLanguage
dc.contributor.authorSoh, AKen_HK
dc.contributor.authorFang, DNen_HK
dc.contributor.authorLee, KLen_HK
dc.date.accessioned2010-09-06T07:18:40Z-
dc.date.available2010-09-06T07:18:40Z-
dc.date.issued2000en_HK
dc.identifier.citationEuropean Journal Of Mechanics A - Solids, 2000, v. 19 n. 6, p. 961-977en_HK
dc.identifier.issn0997-7538en_HK
dc.identifier.urihttp://hdl.handle.net/10722/76207-
dc.description.abstractThe behaviour of a bi-piezoelectric ceramic layer with a centre interfacial crack subjected to anti-plane shear and in-plane electric loading has been studied. The dislocation density functions and the Fourier integral transform method have been employed to eliminate the problem of singular integral equations. The normalized energy release rate, stress and electrical displacement intensity factors, G/G0, KIII/KIII0 and KD/KD0, respectively, were determined for different geometric and property parameters by use of two different crack surface electric boundary conditions, i.e. impermeable and permeable. It has been shown that the effects of the thickness and material constants of the piezoelectric layer on all the three parameters, i.e. G/G0, KIII/KIII0 and KD/KD0 were significant.en_HK
dc.languageengen_HK
dc.publisherElsevier France, Editions Scientifiques et Medicales. The Journal's web site is located at http://www.elsevier.com/locate/ejmsolen_HK
dc.relation.ispartofEuropean Journal Of Mechanics A - Solidsen_HK
dc.rightsEuropean Journal of Mechanics A - Solids. Copyright © Elsevier France, Editions Scientifiques et Medicales.en_HK
dc.titleAnalysis of a bi-piezoelectric ceramic layer with an interfacial crack subjected to anti-plane shear and in-plane electric loadingen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0997-7538&volume=19 &issue=6&spage=961&epage=977&date=2000&atitle=Analysis+of+a+bi-piezoelectric+ceramic+layer+with+an+interfacial+crack+subjected+to+anti-plane+shear+and+in-plane+electric+loadingen_HK
dc.identifier.emailSoh, AK:aksoh@hkucc.hku.hken_HK
dc.identifier.authoritySoh, AK=rp00170en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0997-7538(00)01107-4en_HK
dc.identifier.scopuseid_2-s2.0-0034323045en_HK
dc.identifier.hkuros59177en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0034323045&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume19en_HK
dc.identifier.issue6en_HK
dc.identifier.spage961en_HK
dc.identifier.epage977en_HK
dc.publisher.placeFranceen_HK
dc.identifier.scopusauthoridSoh, AK=7006795203en_HK
dc.identifier.scopusauthoridFang, DN=7202133612en_HK
dc.identifier.scopusauthoridLee, KL=7501505110en_HK

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