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Article: Finite element formulations of strain gradient theory for microstructures and the C0-1 patch test

TitleFinite element formulations of strain gradient theory for microstructures and the C0-1 patch test
Authors
KeywordsC0-1 patch test
Finite element method
Strain gradient theory
Issue Date2004
PublisherJohn Wiley & Sons Ltd. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/1430
Citation
International Journal For Numerical Methods In Engineering, 2004, v. 61 n. 3, p. 433-454 How to Cite?
AbstractBased on finite element formulations for the strain gradient theory of microstructures, a convergence criterion for the C0-1 patch test is introduced, and a new approach to devise strain gradient finite elements that can pass the C0-1 patch test is proposed. The displacement functions of several plane triangular elements, which satisfy the C0 continuity and weak C1 continuity conditions are evaluated by the C0-1 patch test. The difference between the proposed C0-1 patch test and the C0 constant stress and C1 constant curvature patch tests is elucidated. An 18-DOF plane strain gradient triangular element (RCT9+RT9), which passes the C0-1 patch test and has no spurious zero energy modes, is proposed. Numerical examples are employed to examine the performance of the proposed element by carrying out the C0-1 patch test and eigenvalue test. The proposed element is found to be without spurious zero energy modes, and it possesses higher accuracy compared with other strain gradient elements. © 2004 John Wiley and Sons, Ltd.
Persistent Identifierhttp://hdl.handle.net/10722/76183
ISSN
2015 Impact Factor: 2.1
2015 SCImago Journal Rankings: 2.007
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorSoh, AKen_HK
dc.contributor.authorWanji, Cen_HK
dc.date.accessioned2010-09-06T07:18:26Z-
dc.date.available2010-09-06T07:18:26Z-
dc.date.issued2004en_HK
dc.identifier.citationInternational Journal For Numerical Methods In Engineering, 2004, v. 61 n. 3, p. 433-454en_HK
dc.identifier.issn0029-5981en_HK
dc.identifier.urihttp://hdl.handle.net/10722/76183-
dc.description.abstractBased on finite element formulations for the strain gradient theory of microstructures, a convergence criterion for the C0-1 patch test is introduced, and a new approach to devise strain gradient finite elements that can pass the C0-1 patch test is proposed. The displacement functions of several plane triangular elements, which satisfy the C0 continuity and weak C1 continuity conditions are evaluated by the C0-1 patch test. The difference between the proposed C0-1 patch test and the C0 constant stress and C1 constant curvature patch tests is elucidated. An 18-DOF plane strain gradient triangular element (RCT9+RT9), which passes the C0-1 patch test and has no spurious zero energy modes, is proposed. Numerical examples are employed to examine the performance of the proposed element by carrying out the C0-1 patch test and eigenvalue test. The proposed element is found to be without spurious zero energy modes, and it possesses higher accuracy compared with other strain gradient elements. © 2004 John Wiley and Sons, Ltd.en_HK
dc.languageengen_HK
dc.publisherJohn Wiley & Sons Ltd. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/1430en_HK
dc.relation.ispartofInternational Journal for Numerical Methods in Engineeringen_HK
dc.rightsInternational Journal for Numerical Methods in Engineering. Copyright © John Wiley & Sons Ltd.en_HK
dc.subjectC0-1 patch testen_HK
dc.subjectFinite element methoden_HK
dc.subjectStrain gradient theoryen_HK
dc.titleFinite element formulations of strain gradient theory for microstructures and the C0-1 patch testen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0029-5981&volume=61&issue=3&spage=433&epage=454&date=2004&atitle=Finite+element+formulations+of+strain+gradient+theory+for+microstructures+and+the+C0-1+patch+testen_HK
dc.identifier.emailSoh, AK:aksoh@hkucc.hku.hken_HK
dc.identifier.authoritySoh, AK=rp00170en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1002/nme.1075en_HK
dc.identifier.scopuseid_2-s2.0-4644332346en_HK
dc.identifier.hkuros98343en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-4644332346&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume61en_HK
dc.identifier.issue3en_HK
dc.identifier.spage433en_HK
dc.identifier.epage454en_HK
dc.identifier.isiWOS:000223870900006-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridSoh, AK=7006795203en_HK
dc.identifier.scopusauthoridWanji, C=6701386210en_HK

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