File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Finite element modeling of electro-mechanically coupled analysis for ferroelectric ceramic materials with defects

TitleFinite element modeling of electro-mechanically coupled analysis for ferroelectric ceramic materials with defects
Authors
Issue Date2001
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/cma
Citation
Computer Methods In Applied Mechanics And Engineering, 2001, v. 190 n. 22-23, p. 2771-2787 How to Cite?
AbstractIn light of the equations of static mechanical and electrical equilibrium of ferroelectric materials, the functional is presented by using the principle of virtual work in this paper. Formulation of the electro-mechanically coupled finite element analysis for ferroelectric materials with defects has been described in details. The effect of depolarization in ferroelectrics has been taken into account in the formulation. In addition, various electric boundary conditions on the crack surfaces in ferroelectric ceramics are implemented in the finite element procedure developed. Thus, the current finite element method (FEM) has been extended to account for the impermeable, permeable and conducting cracks, by considering that the crack gap is filled with homogenous dielectric media. As an example, the crack propagation of a double edge notched specimen of a PZT-5H ferroelectric ceramic with exact electric boundary conditions on the crack surfaces is analyzed. © 2001 Elsevier Science B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/76019
ISSN
2015 Impact Factor: 3.467
2015 SCImago Journal Rankings: 2.952
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorFang, Den_HK
dc.contributor.authorSoh, AKen_HK
dc.date.accessioned2010-09-06T07:16:50Z-
dc.date.available2010-09-06T07:16:50Z-
dc.date.issued2001en_HK
dc.identifier.citationComputer Methods In Applied Mechanics And Engineering, 2001, v. 190 n. 22-23, p. 2771-2787en_HK
dc.identifier.issn0045-7825en_HK
dc.identifier.urihttp://hdl.handle.net/10722/76019-
dc.description.abstractIn light of the equations of static mechanical and electrical equilibrium of ferroelectric materials, the functional is presented by using the principle of virtual work in this paper. Formulation of the electro-mechanically coupled finite element analysis for ferroelectric materials with defects has been described in details. The effect of depolarization in ferroelectrics has been taken into account in the formulation. In addition, various electric boundary conditions on the crack surfaces in ferroelectric ceramics are implemented in the finite element procedure developed. Thus, the current finite element method (FEM) has been extended to account for the impermeable, permeable and conducting cracks, by considering that the crack gap is filled with homogenous dielectric media. As an example, the crack propagation of a double edge notched specimen of a PZT-5H ferroelectric ceramic with exact electric boundary conditions on the crack surfaces is analyzed. © 2001 Elsevier Science B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/cmaen_HK
dc.relation.ispartofComputer Methods in Applied Mechanics and Engineeringen_HK
dc.rightsComputer Methods in Applied Mechanics and Engineering. Copyright © Elsevier BV.en_HK
dc.titleFinite element modeling of electro-mechanically coupled analysis for ferroelectric ceramic materials with defectsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0045-7825&volume=190 &issue=22-23&spage=2771&epage=2787&date=2001&atitle=Finite+element+modeling+of+electro-mechanically+coupled+analysis+for+ferroelectric+ceramic+materials+with+defectsen_HK
dc.identifier.emailSoh, AK:aksoh@hkucc.hku.hken_HK
dc.identifier.authoritySoh, AK=rp00170en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0045-7825(00)00269-3en_HK
dc.identifier.scopuseid_2-s2.0-0035895482en_HK
dc.identifier.hkuros59169en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0035895482&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume190en_HK
dc.identifier.issue22-23en_HK
dc.identifier.spage2771en_HK
dc.identifier.epage2787en_HK
dc.identifier.isiWOS:000167642800003-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridFang, D=7202133612en_HK
dc.identifier.scopusauthoridSoh, AK=7006795203en_HK

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats