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Article: Micromagnetic modeling studies on the effects of stress on magnetization reversal and dynamic hysteresis

TitleMicromagnetic modeling studies on the effects of stress on magnetization reversal and dynamic hysteresis
Authors
KeywordsCoercivity
Hysteresis loop
Magnetostriction
Micromagnetism
Scaling
Issue Date2006
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jmmm
Citation
Journal Of Magnetism And Magnetic Materials, 2006, v. 301 n. 2, p. 458-468 How to Cite?
AbstractThe complex behaviors of magnetic materials subjected to magneto-electro-mechanical coupled fields call for a better understanding of the mechanism of multi-fields coupling. In this paper, micromagnetic modeling is carried out to study the effect of stress on hysteresis loops and dynamic magnetization reversal. The time-dependent Landau-Lifshitz-Gilbert equation which governs the evolution of magnetization is solved using the fast Fourier transform technique in reciprocal space. The simulation results show that the stress changes the distribution of easy directions and, therefore, leads to the change of magnetic properties. Moreover, the positive product of the stress and saturation magnetostriction coefficients increases the coercivity, hence, increases the area enclosed by the hysteresis loop. A stress-induced magnetization reversal is investigated. © 2005 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/75822
ISSN
2015 Impact Factor: 2.357
2015 SCImago Journal Rankings: 0.776
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorHu, Ren_HK
dc.contributor.authorSoh, AKen_HK
dc.contributor.authorZheng, GPen_HK
dc.contributor.authorNi, Yen_HK
dc.date.accessioned2010-09-06T07:14:54Z-
dc.date.available2010-09-06T07:14:54Z-
dc.date.issued2006en_HK
dc.identifier.citationJournal Of Magnetism And Magnetic Materials, 2006, v. 301 n. 2, p. 458-468en_HK
dc.identifier.issn0304-8853en_HK
dc.identifier.urihttp://hdl.handle.net/10722/75822-
dc.description.abstractThe complex behaviors of magnetic materials subjected to magneto-electro-mechanical coupled fields call for a better understanding of the mechanism of multi-fields coupling. In this paper, micromagnetic modeling is carried out to study the effect of stress on hysteresis loops and dynamic magnetization reversal. The time-dependent Landau-Lifshitz-Gilbert equation which governs the evolution of magnetization is solved using the fast Fourier transform technique in reciprocal space. The simulation results show that the stress changes the distribution of easy directions and, therefore, leads to the change of magnetic properties. Moreover, the positive product of the stress and saturation magnetostriction coefficients increases the coercivity, hence, increases the area enclosed by the hysteresis loop. A stress-induced magnetization reversal is investigated. © 2005 Elsevier B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jmmmen_HK
dc.relation.ispartofJournal of Magnetism and Magnetic Materialsen_HK
dc.rightsJournal of Magnetism and Magnetic Materials. Copyright © Elsevier BV.en_HK
dc.subjectCoercivityen_HK
dc.subjectHysteresis loopen_HK
dc.subjectMagnetostrictionen_HK
dc.subjectMicromagnetismen_HK
dc.subjectScalingen_HK
dc.titleMicromagnetic modeling studies on the effects of stress on magnetization reversal and dynamic hysteresisen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0304-8853&volume=301&issue=2&spage=458&epage=468&date=2006&atitle=Micromagnetic+modeling+studies+on+the+effects+of+stress+on+magnetization+reversal+and+dynamic+hysteresisen_HK
dc.identifier.emailSoh, AK:aksoh@hkucc.hku.hken_HK
dc.identifier.authoritySoh, AK=rp00170en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.jmmm.2005.07.023en_HK
dc.identifier.scopuseid_2-s2.0-33646482256en_HK
dc.identifier.hkuros116472en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33646482256&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume301en_HK
dc.identifier.issue2en_HK
dc.identifier.spage458en_HK
dc.identifier.epage468en_HK
dc.identifier.isiWOS:000236683100026-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridHu, R=13606954800en_HK
dc.identifier.scopusauthoridSoh, AK=7006795203en_HK
dc.identifier.scopusauthoridZheng, GP=13309928700en_HK
dc.identifier.scopusauthoridNi, Y=16836857400en_HK

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