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Article: An approach for analysis of poled/depolarized piezoelectric materials with a crack

TitleAn approach for analysis of poled/depolarized piezoelectric materials with a crack
Authors
KeywordsCrack growth
Pded/depolarized ceramics
Piezoelectric ceramics
Issue Date2001
PublisherSpringer Verlag Dordrecht. The Journal's web site is located at http://springerlink.metapress.com/openurl.asp?genre=journal&issn=0376-9429
Citation
International Journal Of Fracture, 2001, v. 111 n. 4, p. 395-407 How to Cite?
AbstractIn this paper, the influence of dielectric medium inside a crack on crack growth, in an infinite poled or depolarized ceramic, has been studied by employing an electric boundary condition derived from the exact boundary conditions proposed by Sosa (1996). The effect of remanent polarization has also been examined. The results obtained show that electric displacement on crack surfaces is not always zero. Hence, for studying fracture problems of piezoelectric ceramics with cracks accurately, the exact boundary conditions should be implemented. In addition, the results indicate that the effect of remanent polarization is equivalent to that of a positive electric field and it cannot be neglected. It is also found that a positive electric field always has a tendency to open a crack, and a negative electric field tends to close a crack.
Persistent Identifierhttp://hdl.handle.net/10722/75590
ISSN
2015 Impact Factor: 1.642
2015 SCImago Journal Rankings: 1.093
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLiu, Ben_HK
dc.contributor.authorFang, DNen_HK
dc.contributor.authorSoh, AKen_HK
dc.contributor.authorHwang, KCen_HK
dc.date.accessioned2010-09-06T07:12:40Z-
dc.date.available2010-09-06T07:12:40Z-
dc.date.issued2001en_HK
dc.identifier.citationInternational Journal Of Fracture, 2001, v. 111 n. 4, p. 395-407en_HK
dc.identifier.issn0376-9429en_HK
dc.identifier.urihttp://hdl.handle.net/10722/75590-
dc.description.abstractIn this paper, the influence of dielectric medium inside a crack on crack growth, in an infinite poled or depolarized ceramic, has been studied by employing an electric boundary condition derived from the exact boundary conditions proposed by Sosa (1996). The effect of remanent polarization has also been examined. The results obtained show that electric displacement on crack surfaces is not always zero. Hence, for studying fracture problems of piezoelectric ceramics with cracks accurately, the exact boundary conditions should be implemented. In addition, the results indicate that the effect of remanent polarization is equivalent to that of a positive electric field and it cannot be neglected. It is also found that a positive electric field always has a tendency to open a crack, and a negative electric field tends to close a crack.en_HK
dc.languageengen_HK
dc.publisherSpringer Verlag Dordrecht. The Journal's web site is located at http://springerlink.metapress.com/openurl.asp?genre=journal&issn=0376-9429en_HK
dc.relation.ispartofInternational Journal of Fractureen_HK
dc.subjectCrack growthen_HK
dc.subjectPded/depolarized ceramicsen_HK
dc.subjectPiezoelectric ceramicsen_HK
dc.titleAn approach for analysis of poled/depolarized piezoelectric materials with a cracken_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0376-9429&volume=111 &issue=4&spage=395&epage=407&date=2001&atitle=An+approach+for+analysis+of+poled/depolarized+piezoelectric+materials+with+a+cracken_HK
dc.identifier.emailSoh, AK:aksoh@hkucc.hku.hken_HK
dc.identifier.authoritySoh, AK=rp00170en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1023/A:1012258311710en_HK
dc.identifier.scopuseid_2-s2.0-0035482797en_HK
dc.identifier.hkuros67136en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0035482797&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume111en_HK
dc.identifier.issue4en_HK
dc.identifier.spage395en_HK
dc.identifier.epage407en_HK
dc.identifier.isiWOS:000172147600006-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridLiu, B=36079151900en_HK
dc.identifier.scopusauthoridFang, DN=7202133612en_HK
dc.identifier.scopusauthoridSoh, AK=7006795203en_HK
dc.identifier.scopusauthoridHwang, KC=7402426543en_HK

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