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Article: Nanoscale fast relaxation events in polyethylene

TitleNanoscale fast relaxation events in polyethylene
Authors
Li, JNgan, AHW
KeywordsCreep
High-temperature deformation
Nanoindentation
Polymers
Issue Date2010
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/scriptamat
Citation
Scripta Materialia, 2010, v. 62 n. 7, p. 488-491 How to Cite?
DOI: http://dx.doi.org/10.1016/j.scriptamat.2009.12.022
AbstractDiscrete relaxation events on the submicron scale were observed during nanoindentation on polyethylene. The frequency with which these events occur increases as the crystallinity of the polyethylene increases, but the effect saturates at high crystallization levels. At a given crystallinity, the occurrence frequency decreases as temperature increases, due possibly to the enhancement of viscous flow as a competing stress relaxation process. The emission rate of the discrete relaxation events also increases with temperature, exhibiting an activation energy of about 0.22 eV. © 2009 Acta Materialia Inc.
Persistent Identifierhttp://hdl.handle.net/10722/75578
ISSN
1359-6462
2023 Impact Factor: 5.3
2023 SCImago Journal Rankings: 1.738
ISI Accession Number ID
WOS:000274888600015
Funding AgencyGrant Number
Research Grants CouncilHKU7156/08E
University Grants CommitteeSEG-HKU06
Croucher Foundation
Funding Information:

The work described in this paper was supported by grants from the Research Grants Council (Project No. HKU7156/08E), as well as from the University Grants Committee (Project No. SEG-HKU06) of the Hong Kong Special Administration Region, China. A.H.W.N. would like to acknowledge support in the form of a Senior Research Fellowship from the Croucher Foundation. J.L. is grateful to Dr. Tang Bin for financial support and technical assistance.

References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorLi, Jen_HK
dc.contributor.authorNgan, AHWen_HK
dc.date.accessioned2010-09-06T07:12:33Z-
dc.date.available2010-09-06T07:12:33Z-
dc.date.issued2010en_HK
dc.identifier.citationScripta Materialia, 2010, v. 62 n. 7, p. 488-491en_HK
dc.identifier.issn1359-6462en_HK
dc.identifier.urihttp://hdl.handle.net/10722/75578-
dc.description.abstractDiscrete relaxation events on the submicron scale were observed during nanoindentation on polyethylene. The frequency with which these events occur increases as the crystallinity of the polyethylene increases, but the effect saturates at high crystallization levels. At a given crystallinity, the occurrence frequency decreases as temperature increases, due possibly to the enhancement of viscous flow as a competing stress relaxation process. The emission rate of the discrete relaxation events also increases with temperature, exhibiting an activation energy of about 0.22 eV. © 2009 Acta Materialia Inc.en_HK
dc.languageengen_HK
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/scriptamaten_HK
dc.relation.ispartofScripta Materialiaen_HK
dc.subjectCreepen_HK
dc.subjectHigh-temperature deformationen_HK
dc.subjectNanoindentationen_HK
dc.subjectPolymersen_HK
dc.titleNanoscale fast relaxation events in polyethyleneen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1359-6462&volume=62&issue=7&spage=488&epage=491&date=2010&atitle=Nanoscale+fast+relaxation+events+in+polyethyleneen_HK
dc.identifier.emailNgan, AHW:hwngan@hkucc.hku.hken_HK
dc.identifier.authorityNgan, AHW=rp00225en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.scriptamat.2009.12.022en_HK
dc.identifier.scopuseid_2-s2.0-74749096069en_HK
dc.identifier.hkuros170079en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-74749096069&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume62en_HK
dc.identifier.issue7en_HK
dc.identifier.spage488en_HK
dc.identifier.epage491en_HK
dc.identifier.isiWOS:000274888600015-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridLi, J=35220215200en_HK
dc.identifier.scopusauthoridNgan, AHW=7006827202en_HK
dc.identifier.citeulike6408351-
dc.identifier.issnl1359-6462-

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