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Article: Two-stage control charts for high yield processes

TitleTwo-stage control charts for high yield processes
Authors
KeywordsControl limits
Cumulative count of conforming chart
High-yield processes
Statistical process control
Two-stage control chart
Issue Date1997
PublisherWorld Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/ijrqse/ijrqse.shtml
Citation
International Journal Of Reliability, Quality And Safety Engineering, 1997, v. 4 n. 2, p. 149-165 How to Cite?
AbstractIn this paper, a two stage control chart for monitoring the defective rate of high-yield processes is proposed and studied. The Cumulative Count of Conforming control chart is generalized by using the number of items inspected until two defective items are observed. As this will increase the time to alarm, a two-stage approach combining both schemes is proposed. The occurrence of a defective within n 1 items inspected in the first stage indicates that the process is out of control. If no defective occurs within n 1 items inspected, the occurrence of two defectives within the next n 2 - n 1 in the second stage also indicates that the process is out of control. The probability of making a false alarm at the first and second stages are equal to α 1 and α 2 respectively. This procedure improves the sensitivity of the control chart in detecting shifting of the process defective rate p when p is at the parts-per-million order of magnitude. © World Scientific Publishing Company.
Persistent Identifierhttp://hdl.handle.net/10722/74291
ISSN
2015 SCImago Journal Rankings: 0.315
References

 

DC FieldValueLanguage
dc.contributor.authorChan, LYen_HK
dc.contributor.authorXie, Men_HK
dc.contributor.authorGoh, TNen_HK
dc.date.accessioned2010-09-06T06:59:50Z-
dc.date.available2010-09-06T06:59:50Z-
dc.date.issued1997en_HK
dc.identifier.citationInternational Journal Of Reliability, Quality And Safety Engineering, 1997, v. 4 n. 2, p. 149-165en_HK
dc.identifier.issn0218-5393en_HK
dc.identifier.urihttp://hdl.handle.net/10722/74291-
dc.description.abstractIn this paper, a two stage control chart for monitoring the defective rate of high-yield processes is proposed and studied. The Cumulative Count of Conforming control chart is generalized by using the number of items inspected until two defective items are observed. As this will increase the time to alarm, a two-stage approach combining both schemes is proposed. The occurrence of a defective within n 1 items inspected in the first stage indicates that the process is out of control. If no defective occurs within n 1 items inspected, the occurrence of two defectives within the next n 2 - n 1 in the second stage also indicates that the process is out of control. The probability of making a false alarm at the first and second stages are equal to α 1 and α 2 respectively. This procedure improves the sensitivity of the control chart in detecting shifting of the process defective rate p when p is at the parts-per-million order of magnitude. © World Scientific Publishing Company.en_HK
dc.languageengen_HK
dc.publisherWorld Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/ijrqse/ijrqse.shtmlen_HK
dc.relation.ispartofInternational Journal of Reliability, Quality and Safety Engineeringen_HK
dc.subjectControl limitsen_HK
dc.subjectCumulative count of conforming charten_HK
dc.subjectHigh-yield processesen_HK
dc.subjectStatistical process controlen_HK
dc.subjectTwo-stage control charten_HK
dc.titleTwo-stage control charts for high yield processesen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0218-5393&volume=4&issue=2&spage=149&epage=165&date=1997&atitle=Two-stage+control+charts+for+high+yield+processesen_HK
dc.identifier.emailChan, LY: plychan@hku.hken_HK
dc.identifier.authorityChan, LY=rp00093en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-0000649618en_HK
dc.identifier.hkuros37671en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0000649618&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume4en_HK
dc.identifier.issue2en_HK
dc.identifier.spage149en_HK
dc.identifier.epage165en_HK
dc.publisher.placeSingaporeen_HK
dc.identifier.scopusauthoridChan, LY=7403540482en_HK
dc.identifier.scopusauthoridXie, M=9634359100en_HK
dc.identifier.scopusauthoridGoh, TN=7102539920en_HK

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