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Article: Robust minimization of lighting variation for real-time defect detection

TitleRobust minimization of lighting variation for real-time defect detection
Authors
Issue Date2004
PublisherAcademic Press. The Journal's web site is located at http://www.academicpress.com/rti
Citation
Real-Time Imaging, 2004, v. 10 n. 6, p. 365-370 How to Cite?
AbstractIn machine vision applications that involve comparing two images, it is necessary to match the capture conditions, which can affect their graylevels. Illumination and exposure are two important causes for lighting variation that we should compensate for in the resulting images. A standard technique for this purpose is to map one of the images to achieve the smallest mean square error (MSE) between the two. However, applications in defect detection for manufacturing processes are more challenging, because the existence of defects would affect the mapping significantly. In this paper, we present a robust method that is more tolerant to defects, and discuss its formulation as a linear programming to achieve fast implementations. This algorithm is also flexible and capable of incorporating further constraints, such as ensuring non-negativity of the pixel values. © 2004 Elsevier Ltd. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/73876
ISSN
2007 Impact Factor: 2.27
2008 SCImago Journal Rankings: 1.368
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLam, EYen_HK
dc.date.accessioned2010-09-06T06:55:37Z-
dc.date.available2010-09-06T06:55:37Z-
dc.date.issued2004en_HK
dc.identifier.citationReal-Time Imaging, 2004, v. 10 n. 6, p. 365-370en_HK
dc.identifier.issn1077-2014en_HK
dc.identifier.urihttp://hdl.handle.net/10722/73876-
dc.description.abstractIn machine vision applications that involve comparing two images, it is necessary to match the capture conditions, which can affect their graylevels. Illumination and exposure are two important causes for lighting variation that we should compensate for in the resulting images. A standard technique for this purpose is to map one of the images to achieve the smallest mean square error (MSE) between the two. However, applications in defect detection for manufacturing processes are more challenging, because the existence of defects would affect the mapping significantly. In this paper, we present a robust method that is more tolerant to defects, and discuss its formulation as a linear programming to achieve fast implementations. This algorithm is also flexible and capable of incorporating further constraints, such as ensuring non-negativity of the pixel values. © 2004 Elsevier Ltd. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherAcademic Press. The Journal's web site is located at http://www.academicpress.com/rtien_HK
dc.relation.ispartofReal-Time Imagingen_HK
dc.titleRobust minimization of lighting variation for real-time defect detectionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1077-2014&volume=10&spage=365&epage=370&date=2004&atitle=Robust+Minimization+Of+Lighting+Variation+For+Real-time+Defect+Detectionen_HK
dc.identifier.emailLam, EY:elam@eee.hku.hken_HK
dc.identifier.authorityLam, EY=rp00131en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.rti.2004.08.001en_HK
dc.identifier.scopuseid_2-s2.0-11844303450en_HK
dc.identifier.hkuros101033en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-11844303450&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume10en_HK
dc.identifier.issue6en_HK
dc.identifier.spage365en_HK
dc.identifier.epage370en_HK
dc.identifier.isiWOS:000226820200003-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridLam, EY=7102890004en_HK

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