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Article: Efficient numerical modeling of random rough surface effects in interconnect resistance extraction
Title | Efficient numerical modeling of random rough surface effects in interconnect resistance extraction | ||||||
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Authors | |||||||
Keywords | Interconnect simulation Power loss Resistance extraction Rough surface effects | ||||||
Issue Date | 2009 | ||||||
Publisher | John Wiley & Sons Ltd. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/1976 | ||||||
Citation | International Journal Of Circuit Theory And Applications, 2009, v. 37 n. 6, p. 751-763 How to Cite? | ||||||
Abstract | Owing to the decreasing skin depth in high-speed analog and digital circuits, surface roughness is playing an increasingly important role in interconnect parasitic extraction. However, the random nature of surface roughness and the complicated electromagnetic behavior baffle satisfactory solutions to the extraction exercise. This paper utilizes a numerically formulated effective conductivity as an efficient measure of the rough surface effects in the resistance extraction to avoid the global discretization of interconnect surfaces. Two numerical methods based on different boundary element formulations are proposed to compute the mean effective conductivity for interconnects with random surface roughness. Numerical experiments compare these two methods in different rough surface patterns to evaluate their efficacy. Copyright© 2008 John Wiley and Sons, Ltd. | ||||||
Persistent Identifier | http://hdl.handle.net/10722/73826 | ||||||
ISSN | 2023 Impact Factor: 1.8 2023 SCImago Journal Rankings: 0.380 | ||||||
ISI Accession Number ID |
Funding Information: Contract/grant sponsor: University Research Committee of the University of Hong Kong | ||||||
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, Q | en_HK |
dc.contributor.author | Wong, N | en_HK |
dc.date.accessioned | 2010-09-06T06:55:08Z | - |
dc.date.available | 2010-09-06T06:55:08Z | - |
dc.date.issued | 2009 | en_HK |
dc.identifier.citation | International Journal Of Circuit Theory And Applications, 2009, v. 37 n. 6, p. 751-763 | en_HK |
dc.identifier.issn | 0098-9886 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/73826 | - |
dc.description.abstract | Owing to the decreasing skin depth in high-speed analog and digital circuits, surface roughness is playing an increasingly important role in interconnect parasitic extraction. However, the random nature of surface roughness and the complicated electromagnetic behavior baffle satisfactory solutions to the extraction exercise. This paper utilizes a numerically formulated effective conductivity as an efficient measure of the rough surface effects in the resistance extraction to avoid the global discretization of interconnect surfaces. Two numerical methods based on different boundary element formulations are proposed to compute the mean effective conductivity for interconnects with random surface roughness. Numerical experiments compare these two methods in different rough surface patterns to evaluate their efficacy. Copyright© 2008 John Wiley and Sons, Ltd. | en_HK |
dc.language | eng | en_HK |
dc.publisher | John Wiley & Sons Ltd. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/1976 | en_HK |
dc.relation.ispartof | International Journal of Circuit Theory and Applications | en_HK |
dc.subject | Interconnect simulation | en_HK |
dc.subject | Power loss | en_HK |
dc.subject | Resistance extraction | en_HK |
dc.subject | Rough surface effects | en_HK |
dc.title | Efficient numerical modeling of random rough surface effects in interconnect resistance extraction | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Chen, Q: q1chen@hku.hk | en_HK |
dc.identifier.email | Wong, N: nwong@eee.hku.hk | en_HK |
dc.identifier.authority | Chen, Q=rp01688 | en_HK |
dc.identifier.authority | Wong, N=rp00190 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1002/cta.492 | en_HK |
dc.identifier.scopus | eid_2-s2.0-68149117207 | en_HK |
dc.identifier.hkuros | 164698 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-68149117207&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 37 | en_HK |
dc.identifier.issue | 6 | en_HK |
dc.identifier.spage | 751 | en_HK |
dc.identifier.epage | 763 | en_HK |
dc.identifier.isi | WOS:000268760900002 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Chen, Q=18133382800 | en_HK |
dc.identifier.scopusauthorid | Wong, N=35235551600 | en_HK |
dc.identifier.issnl | 0098-9886 | - |