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Article: Error probability of binary phase shift keying in Nakagami-m fading channel with phase noise

TitleError probability of binary phase shift keying in Nakagami-m fading channel with phase noise
Authors
Issue Date2000
PublisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Citation
Electronics Letters, 2000, v. 36 n. 21, p. 1773-1774 How to Cite?
AbstractThe error performance of coherent detection of binary phase shift keying (BPSK) signals with noisy phase reference is analyzed. The analysis is done for a flat Nakagami-m fading channel and in the presence of additive white Gaussian noise. Closed-form expressions for the average bit error rate are derived by assuming Gaussian and Tichinov probability density functions. The local phase reference is reconstructed from a noise-corrupted version of a received signal which results in a phase error.
Persistent Identifierhttp://hdl.handle.net/10722/73755
ISSN
2015 Impact Factor: 0.854
2015 SCImago Journal Rankings: 0.549
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLo, CMen_HK
dc.contributor.authorLam, WHen_HK
dc.date.accessioned2010-09-06T06:54:27Z-
dc.date.available2010-09-06T06:54:27Z-
dc.date.issued2000en_HK
dc.identifier.citationElectronics Letters, 2000, v. 36 n. 21, p. 1773-1774en_HK
dc.identifier.issn0013-5194en_HK
dc.identifier.urihttp://hdl.handle.net/10722/73755-
dc.description.abstractThe error performance of coherent detection of binary phase shift keying (BPSK) signals with noisy phase reference is analyzed. The analysis is done for a flat Nakagami-m fading channel and in the presence of additive white Gaussian noise. Closed-form expressions for the average bit error rate are derived by assuming Gaussian and Tichinov probability density functions. The local phase reference is reconstructed from a noise-corrupted version of a received signal which results in a phase error.en_HK
dc.languageengen_HK
dc.publisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/ELen_HK
dc.relation.ispartofElectronics Lettersen_HK
dc.titleError probability of binary phase shift keying in Nakagami-m fading channel with phase noiseen_HK
dc.typeArticleen_HK
dc.identifier.emailLam, WH:whlam@eee.hku.hken_HK
dc.identifier.authorityLam, WH=rp00136en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1049/el:20001273en_HK
dc.identifier.scopuseid_2-s2.0-0034295599en_HK
dc.identifier.hkuros58846en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0034295599&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume36en_HK
dc.identifier.issue21en_HK
dc.identifier.spage1773en_HK
dc.identifier.epage1774en_HK
dc.identifier.isiWOS:000090131400015-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridLo, CM=34267960100en_HK
dc.identifier.scopusauthoridLam, WH=7203021916en_HK

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