Article: The characterization of the optical functions of BCP and CBP thin films by spectroscopic ellipsometry

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TitleThe characterization of the optical functions of BCP and CBP thin films by spectroscopic ellipsometry
AuthorsLiu, ZT1
Kwong, CY1
Cheung, CH1
Djurišić, AB1
Chan, Y1
Chui, PC1
KeywordsMicrocavity
Organic light emitting diodes (OLEDs)
Issue Date2005
PublisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/synmet
CitationSynthetic Metals, 2005, v. 150 n. 2, p. 159-163 [How to Cite?]
DOI: http://dx.doi.org/10.1016/j.synthmet.2005.02.001
AbstractThe optical properties of 2,9-dimethyl-4,7-diphenyl-l,10-phenanthroline (bathocuproine or BCP) and 4,4′-bis(carbazol-9-yl)biphenyl (CBP) thin films were characterized by spectroscopic ellipsometry (SE). Thin films of BCP and CBP were evaporated on silicon substrates. Spectroscopic ellipsometry measurements were performed in the wavelength range of 300-1000 nm. The refractive indices and extinction coefficients of BCP and CBP were determined by fitting the obtained data using Lorentz model and Relaxed Lorentz (RL) model with variable thicknesses. The extinction coefficients obtained from the fitting of ellipsometry data were in excellent agreement with absorbance measurement results. © 2005 Elsevier B.V. All rights reserved.
ISSN0379-6779
2011 Impact Factor: 1.829
2011 SCImago Journal Rankings: 0.139
DOIhttp://dx.doi.org/10.1016/j.synthmet.2005.02.001
ISI Accession Number IDWOS:000229169500009
ReferencesReferences in Scopus
DC Field
Value
dc.contributor.authorLiu, ZT
dc.contributor.authorKwong, CY
dc.contributor.authorCheung, CH
dc.contributor.authorDjurišić, AB
dc.contributor.authorChan, Y
dc.contributor.authorChui, PC
dc.date.accessioned2010-09-06T06:52:48Z
dc.date.available2010-09-06T06:52:48Z
dc.date.issued2005
dc.description.abstractThe optical properties of 2,9-dimethyl-4,7-diphenyl-l,10-phenanthroline (bathocuproine or BCP) and 4,4′-bis(carbazol-9-yl)biphenyl (CBP) thin films were characterized by spectroscopic ellipsometry (SE). Thin films of BCP and CBP were evaporated on silicon substrates. Spectroscopic ellipsometry measurements were performed in the wavelength range of 300-1000 nm. The refractive indices and extinction coefficients of BCP and CBP were determined by fitting the obtained data using Lorentz model and Relaxed Lorentz (RL) model with variable thicknesses. The extinction coefficients obtained from the fitting of ellipsometry data were in excellent agreement with absorbance measurement results. © 2005 Elsevier B.V. All rights reserved.
dc.description.natureLink_to_subscribed_fulltext
dc.identifier.citationSynthetic Metals, 2005, v. 150 n. 2, p. 159-163 [How to Cite?]
DOI: http://dx.doi.org/10.1016/j.synthmet.2005.02.001
dc.identifier.doihttp://dx.doi.org/10.1016/j.synthmet.2005.02.001
dc.identifier.epage163
dc.identifier.hkuros97735
dc.identifier.isiWOS:000229169500009
dc.identifier.issn0379-6779
2011 Impact Factor: 1.829
2011 SCImago Journal Rankings: 0.139
dc.identifier.issue2
dc.identifier.openurl
dc.identifier.scopuseid_2-s2.0-17644394900
dc.identifier.spage159
dc.identifier.urihttp://hdl.handle.net/10722/73587
dc.identifier.volume150
dc.languageeng
dc.publisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/synmet
dc.publisher.placeSwitzerland
dc.relation.ispartofSynthetic Metals
dc.relation.referencesReferences in Scopus
dc.subjectMicrocavity
dc.subjectOrganic light emitting diodes (OLEDs)
dc.titleThe characterization of the optical functions of BCP and CBP thin films by spectroscopic ellipsometry
dc.typeArticle
Author Affiliations
  1. The University of Hong Kong