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Article: Nanocomposite hole injection layer for organic device applications

TitleNanocomposite hole injection layer for organic device applications
Authors
KeywordsAtomic force microscopy
Electrical measurements and properties
Optoelectronic devices
Organic semiconductors
Issue Date2005
PublisherElsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsf
Citation
Thin Solid Films, 2005, v. 492 n. 1-2, p. 253-258 How to Cite?
Abstract
Nanocomposite layers consisting of poly(3,4,-ethylene dioxythiophene): polystyrene sulfonic acid (PEDOT:PSS) and inorganic nanoparticles (Ni, Cu, and NiO) were investigated as hole injection layers in organic light emitting diodes (OLEDs) consisting of N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as a hole transporting and tris (8-hydroxyquinoline) aluminum as electron transporting and emitting layer. It was found that the addition of Cu and NiO nanoparticles resulted in inferior OLED performance for all nanoparticle concentrations, while for Ni nanoparticles, improved performance was obtained for optimized nanoparticle concentration compared to the devices with pure PEDOT:PSS. Reasons for the improved performance of devices with PEDOT:PSS:Ni layers are discussed. It appears that increase of the current driven into the diode is the reason for the improvement of OLED performances achieved by incorporating Ni-nanoparticles into the injection layer. © 2005 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/69825
ISSN
2013 Impact Factor: 1.867
2013 SCImago Journal Rankings: 0.884
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorOey, CCen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorKwong, CYen_HK
dc.contributor.authorCheung, CHen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorNunzi, JMen_HK
dc.contributor.authorChui, PCen_HK
dc.date.accessioned2010-09-06T06:17:11Z-
dc.date.available2010-09-06T06:17:11Z-
dc.date.issued2005en_HK
dc.identifier.citationThin Solid Films, 2005, v. 492 n. 1-2, p. 253-258en_HK
dc.identifier.issn0040-6090en_HK
dc.identifier.urihttp://hdl.handle.net/10722/69825-
dc.description.abstractNanocomposite layers consisting of poly(3,4,-ethylene dioxythiophene): polystyrene sulfonic acid (PEDOT:PSS) and inorganic nanoparticles (Ni, Cu, and NiO) were investigated as hole injection layers in organic light emitting diodes (OLEDs) consisting of N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as a hole transporting and tris (8-hydroxyquinoline) aluminum as electron transporting and emitting layer. It was found that the addition of Cu and NiO nanoparticles resulted in inferior OLED performance for all nanoparticle concentrations, while for Ni nanoparticles, improved performance was obtained for optimized nanoparticle concentration compared to the devices with pure PEDOT:PSS. Reasons for the improved performance of devices with PEDOT:PSS:Ni layers are discussed. It appears that increase of the current driven into the diode is the reason for the improvement of OLED performances achieved by incorporating Ni-nanoparticles into the injection layer. © 2005 Elsevier B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsfen_HK
dc.relation.ispartofThin Solid Filmsen_HK
dc.subjectAtomic force microscopyen_HK
dc.subjectElectrical measurements and propertiesen_HK
dc.subjectOptoelectronic devicesen_HK
dc.subjectOrganic semiconductorsen_HK
dc.titleNanocomposite hole injection layer for organic device applicationsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0040-6090&volume=492&spage=253&epage=258&date=2005&atitle=Nanocomposite+hole+injection+layer+for+organic+device+applicationsen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailChui, PC: pcchui@hkucc.hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityChui, PC=rp00114en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.tsf.2005.07.118en_HK
dc.identifier.scopuseid_2-s2.0-25644449764en_HK
dc.identifier.hkuros105073en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-25644449764&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume492en_HK
dc.identifier.issue1-2en_HK
dc.identifier.spage253en_HK
dc.identifier.epage258en_HK
dc.identifier.isiWOS:000232592100042-
dc.publisher.placeSwitzerlanden_HK
dc.identifier.scopusauthoridOey, CC=8694346600en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridKwong, CY=35917741900en_HK
dc.identifier.scopusauthoridCheung, CH=8618960900en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridNunzi, JM=7005235497en_HK
dc.identifier.scopusauthoridChui, PC=13309913400en_HK

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