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Article: Growth of electrodeposited platinum nanocrystals studied by atomic force microscopy

TitleGrowth of electrodeposited platinum nanocrystals studied by atomic force microscopy
Authors
KeywordsAtomic force microscopy
Electrodeposition
Graphite
Nanoparticles
Issue Date1998
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsusc
Citation
Applied Surface Science, 1998, v. 136 n. 4, p. 321-330 How to Cite?
AbstractPlatinum crystal growth by electrochemical deposition on highly orientated pyrolytic graphite (HOPG) surfaces was studied by atomic force microscopy (AFM) operated in the tapping mode. In the absence of a supporting electrolyte, 2D Pt nanoparticles aggregated. After reaching a critical mobile particle size, subsequent growth of platinum morphology appeared to be dominated by surface diffusion of mobile Pt particles. In the presence of HClO4, 3D growth of deposited platinum appeared to be the dominant mechanism. Various morphologies of Pt electrodeposition on HOPG are the consequence of competing 3D growth and 2D particle growth. Anions specifically adsorbed on platinum may also play an important role in affecting 2D versus 3D crystal growth. © 1998 Published by Elsevier Science B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/69492
ISSN
2015 Impact Factor: 3.15
2015 SCImago Journal Rankings: 0.930
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLee, Ien_HK
dc.contributor.authorChan, KYen_HK
dc.contributor.authorPhillips, DLen_HK
dc.date.accessioned2010-09-06T06:14:09Z-
dc.date.available2010-09-06T06:14:09Z-
dc.date.issued1998en_HK
dc.identifier.citationApplied Surface Science, 1998, v. 136 n. 4, p. 321-330en_HK
dc.identifier.issn0169-4332en_HK
dc.identifier.urihttp://hdl.handle.net/10722/69492-
dc.description.abstractPlatinum crystal growth by electrochemical deposition on highly orientated pyrolytic graphite (HOPG) surfaces was studied by atomic force microscopy (AFM) operated in the tapping mode. In the absence of a supporting electrolyte, 2D Pt nanoparticles aggregated. After reaching a critical mobile particle size, subsequent growth of platinum morphology appeared to be dominated by surface diffusion of mobile Pt particles. In the presence of HClO4, 3D growth of deposited platinum appeared to be the dominant mechanism. Various morphologies of Pt electrodeposition on HOPG are the consequence of competing 3D growth and 2D particle growth. Anions specifically adsorbed on platinum may also play an important role in affecting 2D versus 3D crystal growth. © 1998 Published by Elsevier Science B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsuscen_HK
dc.relation.ispartofApplied Surface Scienceen_HK
dc.rightsApplied Surface Science. Copyright © Elsevier BV.en_HK
dc.subjectAtomic force microscopyen_HK
dc.subjectElectrodepositionen_HK
dc.subjectGraphiteen_HK
dc.subjectNanoparticlesen_HK
dc.titleGrowth of electrodeposited platinum nanocrystals studied by atomic force microscopyen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0169-4332&volume=136&spage=321&epage=330&date=1998&atitle=Growth+of+electrodeposited+platinum+nanocrystals+studied+by+atomic+force+microscopyen_HK
dc.identifier.emailChan, KY:hrsccky@hku.hken_HK
dc.identifier.emailPhillips, DL:phillips@hku.hken_HK
dc.identifier.authorityChan, KY=rp00662en_HK
dc.identifier.authorityPhillips, DL=rp00770en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0169-4332(98)00355-9-
dc.identifier.scopuseid_2-s2.0-0032304945en_HK
dc.identifier.hkuros39942en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0032304945&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume136en_HK
dc.identifier.issue4en_HK
dc.identifier.spage321en_HK
dc.identifier.epage330en_HK
dc.identifier.isiWOS:000077851200006-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridLee, I=7404437956en_HK
dc.identifier.scopusauthoridChan, KY=7406034142en_HK
dc.identifier.scopusauthoridPhillips, DL=7404519365en_HK

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