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Article: Influence of Sample Surface Condition on Chemical Analysis Using Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy

TitleInfluence of Sample Surface Condition on Chemical Analysis Using Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy
Authors
KeywordsDirect solid sampling
Inductively coupled plasma atomic emission spectroscopy
Laser ablation
Laser-induced plasma
Issue Date1997
PublisherSociety for Applied Spectroscopy. The Journal's web site is located at http://www.s-a-s.org/journal/on-line_journal.htm
Citation
Applied Spectroscopy, 1997, v. 51 n. 7, p. 1047-1054 How to Cite?
AbstractThe influence of sample surface condition on chemical analysis was investigated when using laser ablation sampling with inductively coupled plasma atomic emission spectroscopy (ICP-AES). The ablated mass quantity and composition were found to be significantly different from original vs. pre-ablated surfaces. The ablated mass quantity from original surfaces was much greater than that from pre-ablated surfaces, and the ablation rate (mass per unit area and time) was constant or independent of power density below 0.3 GW/cm2. For pre-ablated surfaces, the mass ablation rate follows exponential behavior in the same power density region. The measured composition of the ablated mass was found to be dependent on the surface condition and laser power density, for both original and pre-ablated surfaces. Understanding the influence of laser energy and surface conditions on mass ablation is essential for accurate and precise chemical analysis.
Persistent Identifierhttp://hdl.handle.net/10722/69209
ISSN
2015 Impact Factor: 1.798
2015 SCImago Journal Rankings: 0.668
References

 

DC FieldValueLanguage
dc.contributor.authorMao, Xen_HK
dc.contributor.authorChan, WTen_HK
dc.contributor.authorRusso, REen_HK
dc.date.accessioned2010-09-06T06:11:34Z-
dc.date.available2010-09-06T06:11:34Z-
dc.date.issued1997en_HK
dc.identifier.citationApplied Spectroscopy, 1997, v. 51 n. 7, p. 1047-1054en_HK
dc.identifier.issn0003-7028en_HK
dc.identifier.urihttp://hdl.handle.net/10722/69209-
dc.description.abstractThe influence of sample surface condition on chemical analysis was investigated when using laser ablation sampling with inductively coupled plasma atomic emission spectroscopy (ICP-AES). The ablated mass quantity and composition were found to be significantly different from original vs. pre-ablated surfaces. The ablated mass quantity from original surfaces was much greater than that from pre-ablated surfaces, and the ablation rate (mass per unit area and time) was constant or independent of power density below 0.3 GW/cm2. For pre-ablated surfaces, the mass ablation rate follows exponential behavior in the same power density region. The measured composition of the ablated mass was found to be dependent on the surface condition and laser power density, for both original and pre-ablated surfaces. Understanding the influence of laser energy and surface conditions on mass ablation is essential for accurate and precise chemical analysis.en_HK
dc.languageengen_HK
dc.publisherSociety for Applied Spectroscopy. The Journal's web site is located at http://www.s-a-s.org/journal/on-line_journal.htmen_HK
dc.relation.ispartofApplied Spectroscopyen_HK
dc.subjectDirect solid samplingen_HK
dc.subjectInductively coupled plasma atomic emission spectroscopyen_HK
dc.subjectLaser ablationen_HK
dc.subjectLaser-induced plasmaen_HK
dc.titleInfluence of Sample Surface Condition on Chemical Analysis Using Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopyen_HK
dc.typeArticleen_HK
dc.identifier.emailChan, WT:wtchan@hku.hken_HK
dc.identifier.authorityChan, WT=rp00668en_HK
dc.description.naturelink_to_OA_fulltext-
dc.identifier.scopuseid_2-s2.0-0031188994en_HK
dc.identifier.hkuros31687en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0031188994&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume51en_HK
dc.identifier.issue7en_HK
dc.identifier.spage1047en_HK
dc.identifier.epage1054en_HK
dc.identifier.scopusauthoridMao, X=7402841260en_HK
dc.identifier.scopusauthoridChan, WT=7403918827en_HK
dc.identifier.scopusauthoridRusso, RE=7201443495en_HK

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