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Article: Atomic force microscopy of platinum nanoparticles prepared on highly oriented pyrolytic graphite

TitleAtomic force microscopy of platinum nanoparticles prepared on highly oriented pyrolytic graphite
Authors
KeywordsElectrochemical deposition
Highly oriented pyrolytic graphite (HOPG)
Platinum nanoparticles
Tapping mode atomic force microscopy (TMAFM)
Issue Date1998
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/ultramic
Citation
Ultramicroscopy, 1998, v. 75 n. 2, p. 69-76 How to Cite?
AbstractPlatinum nanoparticles with a narrow size distribution were prepared on highly orientated pyrolytic graphite (HOPG) surfaces by electrochemical deposition. The surfaces were characterized by atomic force microscopy operated in air in the tapping mode. Particle sizes between 20 and 100 nm can be prepared by using different deposition times and overpotentials. The deposition appears to be controlled by interfacial electron transfer and diffusion. Adding a supporting electrolyte will reduce non-faradiac charging resistance and the apparent deposition time scale. While isolated particles are formed at short deposition times, connected clusters of various morphologies can be observed at long deposition times. | Platinum nanoparticles with a narrow size distribution were prepared on highly orientated pyrolytic graphite (HOPG) surfaces by electrochemical deposition. The surfaces were characterized by atomic force microscopy operated in air in the tapping mode. Particle sizes between 20 and 100 nm can be prepared by using different deposition times and overpotentials. The deposition appears to be controlled by interfacial electron transfer and diffusion. Adding a supporting electrolyte will reduce non-faradiac charging resistance and the apparent deposition time scale. While isolated particles are formed at short deposition times, connected clusters of various morphologies can be observed at long deposition times.
Persistent Identifierhttp://hdl.handle.net/10722/69143
ISSN
2015 Impact Factor: 2.874
2015 SCImago Journal Rankings: 2.140
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLee, Ien_HK
dc.contributor.authorChan, KYen_HK
dc.contributor.authorPhillips, DLen_HK
dc.date.accessioned2010-09-06T06:10:57Z-
dc.date.available2010-09-06T06:10:57Z-
dc.date.issued1998en_HK
dc.identifier.citationUltramicroscopy, 1998, v. 75 n. 2, p. 69-76en_HK
dc.identifier.issn0304-3991en_HK
dc.identifier.urihttp://hdl.handle.net/10722/69143-
dc.description.abstractPlatinum nanoparticles with a narrow size distribution were prepared on highly orientated pyrolytic graphite (HOPG) surfaces by electrochemical deposition. The surfaces were characterized by atomic force microscopy operated in air in the tapping mode. Particle sizes between 20 and 100 nm can be prepared by using different deposition times and overpotentials. The deposition appears to be controlled by interfacial electron transfer and diffusion. Adding a supporting electrolyte will reduce non-faradiac charging resistance and the apparent deposition time scale. While isolated particles are formed at short deposition times, connected clusters of various morphologies can be observed at long deposition times. | Platinum nanoparticles with a narrow size distribution were prepared on highly orientated pyrolytic graphite (HOPG) surfaces by electrochemical deposition. The surfaces were characterized by atomic force microscopy operated in air in the tapping mode. Particle sizes between 20 and 100 nm can be prepared by using different deposition times and overpotentials. The deposition appears to be controlled by interfacial electron transfer and diffusion. Adding a supporting electrolyte will reduce non-faradiac charging resistance and the apparent deposition time scale. While isolated particles are formed at short deposition times, connected clusters of various morphologies can be observed at long deposition times.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/ultramicen_HK
dc.relation.ispartofUltramicroscopyen_HK
dc.rightsUltramicroscopy. Copyright © Elsevier BV.en_HK
dc.subjectElectrochemical depositionen_HK
dc.subjectHighly oriented pyrolytic graphite (HOPG)en_HK
dc.subjectPlatinum nanoparticlesen_HK
dc.subjectTapping mode atomic force microscopy (TMAFM)en_HK
dc.titleAtomic force microscopy of platinum nanoparticles prepared on highly oriented pyrolytic graphiteen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0304-3991&volume=75&spage=69&epage=76&date=1998&atitle=Atomic+force+microscopy+of+platinum+nanoparticles+prepared+on+highly+oriented+pyrolytic+graphiteen_HK
dc.identifier.emailChan, KY:hrsccky@hku.hken_HK
dc.identifier.emailPhillips, DL:phillips@hku.hken_HK
dc.identifier.authorityChan, KY=rp00662en_HK
dc.identifier.authorityPhillips, DL=rp00770en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0304-3991(98)00055-2en_HK
dc.identifier.scopuseid_2-s2.0-0032213798en_HK
dc.identifier.hkuros39975en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0032213798&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume75en_HK
dc.identifier.issue2en_HK
dc.identifier.spage69en_HK
dc.identifier.epage76en_HK
dc.identifier.isiWOS:000077080600002-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridLee, I=7404437956en_HK
dc.identifier.scopusauthoridChan, KY=7406034142en_HK
dc.identifier.scopusauthoridPhillips, DL=7404519365en_HK

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