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Article: Dependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position

TitleDependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer position
Authors
KeywordsElectroluminescence
Evaporation
Organic light emitting diode
Issue Date2005
PublisherElsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsf
Citation
Thin Solid Films, 2005, v. 489 n. 1-2, p. 235-244 How to Cite?
Abstract
In this work, we present a systematic study of the emission from bilayer organic microcavity light emitting diodes with two metal mirrors. The devices consisting of two organic layers, N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as the hole transport layer and tris (8-hydroxyquinoline) aluminum as the emitting layer, and two metal mirrors were fabricated and characterized by transmittance, reflectance, photoluminescence, and electroluminescence measurements. The effects of layer thickness, interface position, and the choice of anode (bottom mirror) were investigated. The transmittance and reflectance spectra were modeled using a transfer matrix model, and the optical functions for all the materials used were determined by spectroscopic ellipsometry. The dependence of the photoluminescence and electroluminescence spectra on the device thickness and interface position is discussed. © 2005 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/68991
ISSN
2013 Impact Factor: 1.867
2013 SCImago Journal Rankings: 0.884
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorCheung, CHen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorKwong, CYen_HK
dc.contributor.authorChan, Jen_HK
dc.contributor.authorRakić, ADen_HK
dc.contributor.authorTam, HLen_HK
dc.contributor.authorCheah, KWen_HK
dc.contributor.authorLiu, ZTen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorChui, PCen_HK
dc.date.accessioned2010-09-06T06:09:33Z-
dc.date.available2010-09-06T06:09:33Z-
dc.date.issued2005en_HK
dc.identifier.citationThin Solid Films, 2005, v. 489 n. 1-2, p. 235-244en_HK
dc.identifier.issn0040-6090en_HK
dc.identifier.urihttp://hdl.handle.net/10722/68991-
dc.description.abstractIn this work, we present a systematic study of the emission from bilayer organic microcavity light emitting diodes with two metal mirrors. The devices consisting of two organic layers, N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine as the hole transport layer and tris (8-hydroxyquinoline) aluminum as the emitting layer, and two metal mirrors were fabricated and characterized by transmittance, reflectance, photoluminescence, and electroluminescence measurements. The effects of layer thickness, interface position, and the choice of anode (bottom mirror) were investigated. The transmittance and reflectance spectra were modeled using a transfer matrix model, and the optical functions for all the materials used were determined by spectroscopic ellipsometry. The dependence of the photoluminescence and electroluminescence spectra on the device thickness and interface position is discussed. © 2005 Elsevier B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsfen_HK
dc.relation.ispartofThin Solid Filmsen_HK
dc.subjectElectroluminescenceen_HK
dc.subjectEvaporationen_HK
dc.subjectOrganic light emitting diodeen_HK
dc.titleDependence of the emission from tris (8-hydroxyquinoline) aluminum based microcavity on device thickness and the emission layer positionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0040-6090&volume=489&spage=235&epage=244&date=2005&atitle=Dependence+of+the+emission+from+tris+(8-hydroxyquinoline)+aluminum+based+microcavity+on+device+thickness+and+the+emission+layer+positionen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailChui, PC: pcchui@hkucc.hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityChui, PC=rp00114en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.tsf.2005.04.106en_HK
dc.identifier.scopuseid_2-s2.0-23144437008en_HK
dc.identifier.hkuros99304en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-23144437008&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume489en_HK
dc.identifier.issue1-2en_HK
dc.identifier.spage235en_HK
dc.identifier.epage244en_HK
dc.identifier.isiWOS:000231435400037-
dc.publisher.placeSwitzerlanden_HK
dc.identifier.scopusauthoridCheung, CH=8618960900en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridKwong, CY=35917741900en_HK
dc.identifier.scopusauthoridChan, J=9234340000en_HK
dc.identifier.scopusauthoridRakić, AD=35618124100en_HK
dc.identifier.scopusauthoridTam, HL=7101835048en_HK
dc.identifier.scopusauthoridCheah, KW=7102792922en_HK
dc.identifier.scopusauthoridLiu, ZT=22934686400en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridChui, PC=13309913400en_HK

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