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Article: Estimation of background continuum emission intensity of inductively coupled plasma for correction of fast changing background

TitleEstimation of background continuum emission intensity of inductively coupled plasma for correction of fast changing background
Authors
KeywordsBackground correction
Direct sample insertion
Electrothermal vaporization
Inductively coupled plasma atomic emission spectrometry
Plasma background
Plasma continuum
Issue Date2002
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/sab
Citation
Spectrochimica Acta - Part B Atomic Spectroscopy, 2002, v. 57 n. 11, p. 1771-1787 How to Cite?
AbstractA method to estimate background continuum emission in inductively coupled plasma-atomic emission spectrometry (ICP-AES) is proposed. The method assumes that the ICP background continuum emission is mainly due to recombinative radiation in the plasma. The emission intensity at an arbitrary wavelength is related to the temperature and electron number density of the plasma. Furthermore, the ratio of background continuum emission intensity at two arbitrary plasma excitation conditions is a constant for all wavelengths. Therefore, if there is a change in plasma excitation conditions, the new background continuum emission intensity at an arbitrary wavelength can be calculated from the initial background emission intensity and the emission intensity ratio that can be measured accurately at another convenient wavelength. In this paper, rather than the emission intensity ratio, the ratio of the differences in intensities is used to remove the contribution of dark current in the measured intensity, if any. The ratio is termed 'f-factor'. Firstly, the background emission intensities at two reference plasma excitation conditions are measured. The f-factors of these two background emission intensities are assigned values 0 and 1, respectively. When the plasma excitation condition changes, the f-factor relative to the reference conditions at an arbitrary wavelength can be calculated from the new emission intensity. The background emission intensity at other wavelengths can then be determined from their corresponding emission intensities at the reference conditions and the new f-factor. Background emission intensity of the ICP (λ=200-460 nm) is measured using an ICP spectrometer with a segmented-array imaging detector. The ICP forward power was varied from 800 to 1500 W. In agreement of the model, the f-factors at any wavelengths remain constant at all forward power used. The proposed method was compared to off-peak background correction method. Analyte concentrations were selected to give signal-to-background ratio of ∼1. The corrected analyte emission intensities using both background correction methods agree, except for Ca 396.847 nm, which suffers from spectral overlap from a nearby hydrogen emission line. The ability of the proposed method for background correction of fast changing background emission was demonstrated using direct sample insertion and a direct reading multi-channel spectrometer. © 2002 Elsevier Science B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/68856
ISSN
2015 Impact Factor: 3.289
2015 SCImago Journal Rankings: 1.031
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorChan, GCYen_HK
dc.contributor.authorChan, WTen_HK
dc.date.accessioned2010-09-06T06:08:21Z-
dc.date.available2010-09-06T06:08:21Z-
dc.date.issued2002en_HK
dc.identifier.citationSpectrochimica Acta - Part B Atomic Spectroscopy, 2002, v. 57 n. 11, p. 1771-1787en_HK
dc.identifier.issn0584-8547en_HK
dc.identifier.urihttp://hdl.handle.net/10722/68856-
dc.description.abstractA method to estimate background continuum emission in inductively coupled plasma-atomic emission spectrometry (ICP-AES) is proposed. The method assumes that the ICP background continuum emission is mainly due to recombinative radiation in the plasma. The emission intensity at an arbitrary wavelength is related to the temperature and electron number density of the plasma. Furthermore, the ratio of background continuum emission intensity at two arbitrary plasma excitation conditions is a constant for all wavelengths. Therefore, if there is a change in plasma excitation conditions, the new background continuum emission intensity at an arbitrary wavelength can be calculated from the initial background emission intensity and the emission intensity ratio that can be measured accurately at another convenient wavelength. In this paper, rather than the emission intensity ratio, the ratio of the differences in intensities is used to remove the contribution of dark current in the measured intensity, if any. The ratio is termed 'f-factor'. Firstly, the background emission intensities at two reference plasma excitation conditions are measured. The f-factors of these two background emission intensities are assigned values 0 and 1, respectively. When the plasma excitation condition changes, the f-factor relative to the reference conditions at an arbitrary wavelength can be calculated from the new emission intensity. The background emission intensity at other wavelengths can then be determined from their corresponding emission intensities at the reference conditions and the new f-factor. Background emission intensity of the ICP (λ=200-460 nm) is measured using an ICP spectrometer with a segmented-array imaging detector. The ICP forward power was varied from 800 to 1500 W. In agreement of the model, the f-factors at any wavelengths remain constant at all forward power used. The proposed method was compared to off-peak background correction method. Analyte concentrations were selected to give signal-to-background ratio of ∼1. The corrected analyte emission intensities using both background correction methods agree, except for Ca 396.847 nm, which suffers from spectral overlap from a nearby hydrogen emission line. The ability of the proposed method for background correction of fast changing background emission was demonstrated using direct sample insertion and a direct reading multi-channel spectrometer. © 2002 Elsevier Science B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/saben_HK
dc.relation.ispartofSpectrochimica Acta - Part B Atomic Spectroscopyen_HK
dc.rightsSpectrochimica Acta Part B: Atomic Spectroscopy. Copyright © Elsevier BV.en_HK
dc.subjectBackground correctionen_HK
dc.subjectDirect sample insertionen_HK
dc.subjectElectrothermal vaporizationen_HK
dc.subjectInductively coupled plasma atomic emission spectrometryen_HK
dc.subjectPlasma backgrounden_HK
dc.subjectPlasma continuumen_HK
dc.titleEstimation of background continuum emission intensity of inductively coupled plasma for correction of fast changing backgrounden_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0584-8547&volume=57&spage=1771&epage=1787&date=2002&atitle=Estimation+of+background+continuum+emission+intensity+of+inductively+coupled+plasma+for+correction+of+fast+changing+backgrounden_HK
dc.identifier.emailChan, WT:wtchan@hku.hken_HK
dc.identifier.authorityChan, WT=rp00668en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0584-8547(02)00143-Xen_HK
dc.identifier.scopuseid_2-s2.0-0037064375en_HK
dc.identifier.hkuros76781en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0037064375&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume57en_HK
dc.identifier.issue11en_HK
dc.identifier.spage1771en_HK
dc.identifier.epage1787en_HK
dc.identifier.isiWOS:000179373300009-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridChan, GCY=7202355292en_HK
dc.identifier.scopusauthoridChan, WT=7403918827en_HK

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