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- Publisher Website: 10.1016/j.joen.2007.07.022
- Scopus: eid_2-s2.0-34548537569
- PMID: 17889693
- WOS: WOS:000249965000015
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Article: Does Electropolishing Improve the Low-cycle Fatigue Behavior of a Nickel-Titanium Rotary Instrument in Hypochlorite?
Title | Does Electropolishing Improve the Low-cycle Fatigue Behavior of a Nickel-Titanium Rotary Instrument in Hypochlorite? |
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Authors | |
Keywords | Breakage corrosion cracking fatigue fracture nickel-titanium root canal instruments |
Issue Date | 2007 |
Publisher | Elsevier Inc. The Journal's web site is located at http://www.jendodon.com |
Citation | Journal Of Endodontics, 2007, v. 33 n. 10, p. 1217-1221 How to Cite? |
Abstract | The purpose of this study was to compare the low-cycle fatigue (LCF) behavior of electropolished and nonelectropolished nickel-titanium (NiTi) instruments of the same design in hypochlorite. Forty-five electropolished and 62 nonelectropolished NiTi engine files were subjected to rotational bending at various curvatures in 1.2% hypochlorite solution. Number of revolutions to failure, crack-initiation sites, extent of slow crack extension into the fracture cross-section, and surface-strain amplitude were noted. A linear relationship was found between LCF life and surface-strain amplitude for both groups, with no discernible difference between the two (p > 0.05). No electropolished instrument showed more than one crack origin, significantly fewer than for the nonelectropolished instruments (p < 0.05). The square root of crack extension and strain amplitude were inversely related. Although surface smoothness is enhanced by electropolishing, this did not protect the instrument from LCF failure. © 2007 American Association of Endodontists. |
Persistent Identifier | http://hdl.handle.net/10722/67069 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 1.356 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Cheung, GSP | en_HK |
dc.contributor.author | Shen, Y | en_HK |
dc.contributor.author | Darvell, BW | en_HK |
dc.date.accessioned | 2010-09-06T05:51:42Z | - |
dc.date.available | 2010-09-06T05:51:42Z | - |
dc.date.issued | 2007 | en_HK |
dc.identifier.citation | Journal Of Endodontics, 2007, v. 33 n. 10, p. 1217-1221 | en_HK |
dc.identifier.issn | 0099-2399 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/67069 | - |
dc.description.abstract | The purpose of this study was to compare the low-cycle fatigue (LCF) behavior of electropolished and nonelectropolished nickel-titanium (NiTi) instruments of the same design in hypochlorite. Forty-five electropolished and 62 nonelectropolished NiTi engine files were subjected to rotational bending at various curvatures in 1.2% hypochlorite solution. Number of revolutions to failure, crack-initiation sites, extent of slow crack extension into the fracture cross-section, and surface-strain amplitude were noted. A linear relationship was found between LCF life and surface-strain amplitude for both groups, with no discernible difference between the two (p > 0.05). No electropolished instrument showed more than one crack origin, significantly fewer than for the nonelectropolished instruments (p < 0.05). The square root of crack extension and strain amplitude were inversely related. Although surface smoothness is enhanced by electropolishing, this did not protect the instrument from LCF failure. © 2007 American Association of Endodontists. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Elsevier Inc. The Journal's web site is located at http://www.jendodon.com | en_HK |
dc.relation.ispartof | Journal of Endodontics | en_HK |
dc.rights | The Journal of Endodontics. Copyright © Lippincott Williams & Wilkins. | en_HK |
dc.subject | Breakage | en_HK |
dc.subject | corrosion | en_HK |
dc.subject | cracking | en_HK |
dc.subject | fatigue | en_HK |
dc.subject | fracture | en_HK |
dc.subject | nickel-titanium | en_HK |
dc.subject | root canal instruments | en_HK |
dc.subject.mesh | Dental Alloys - chemistry | en_HK |
dc.subject.mesh | Dental Polishing - methods | en_HK |
dc.subject.mesh | Disinfectants - chemistry | en_HK |
dc.subject.mesh | Equipment Design | en_HK |
dc.subject.mesh | Equipment Failure | en_HK |
dc.subject.mesh | Humans | en_HK |
dc.subject.mesh | Materials Testing | en_HK |
dc.subject.mesh | Nickel - chemistry | en_HK |
dc.subject.mesh | Root Canal Preparation - instrumentation | en_HK |
dc.subject.mesh | Rotation | en_HK |
dc.subject.mesh | Sodium Hypochlorite - chemistry | en_HK |
dc.subject.mesh | Stress, Mechanical | en_HK |
dc.subject.mesh | Surface Properties | en_HK |
dc.subject.mesh | Titanium - chemistry | en_HK |
dc.title | Does Electropolishing Improve the Low-cycle Fatigue Behavior of a Nickel-Titanium Rotary Instrument in Hypochlorite? | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0099-2399&volume=33&spage=1217&epage=1221&date=2007&atitle=Does+electropolishing+improve+the+low-cycle+fatigue+behavior+of+a+nickel-titanium+rotary+instrument+in+hypochlorite? | en_HK |
dc.identifier.email | Cheung, GSP: spcheung@hkucc.hku.hk | en_HK |
dc.identifier.email | Darvell, BW: b.w.darvell@hku.hk | en_HK |
dc.identifier.authority | Cheung, GSP=rp00016 | en_HK |
dc.identifier.authority | Darvell, BW=rp00007 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/j.joen.2007.07.022 | en_HK |
dc.identifier.pmid | 17889693 | - |
dc.identifier.scopus | eid_2-s2.0-34548537569 | en_HK |
dc.identifier.hkuros | 138256 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-34548537569&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 33 | en_HK |
dc.identifier.issue | 10 | en_HK |
dc.identifier.spage | 1217 | en_HK |
dc.identifier.epage | 1221 | en_HK |
dc.identifier.isi | WOS:000249965000015 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Cheung, GSP=7005809531 | en_HK |
dc.identifier.scopusauthorid | Shen, Y=7404767171 | en_HK |
dc.identifier.scopusauthorid | Darvell, BW=7005953926 | en_HK |
dc.identifier.issnl | 0099-2399 | - |