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- Scopus: eid_2-s2.0-2942582880
- PMID: 15195732
- WOS: WOS:000221412700011
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Article: Aggressiveness of self-etch adhesives on unground enamel
Title | Aggressiveness of self-etch adhesives on unground enamel |
---|---|
Authors | |
Issue Date | 2004 |
Publisher | Operative Dentistry. The Journal's web site is located at http://www.jopdent.org |
Citation | Operative Dentistry, 2004, v. 29 n. 3, p. 309-316 How to Cite? |
Abstract | Manufacturers of mild self-etch adhesives advocate the adjunctive use of phosphoric acid etching when bonding to unground enamel. This study tested the null hypothesis that there is no difference between the recently introduced, more aggressive self-etch adhesives and a total-etch adhesive in bonding to unground enamel. The ultrastructure and microtensile bond strengths (μTBS) of Xeno III (Dentsply) and Simplicity (Apex Dental Materials), bonded to unground enamel, were examined after thermocycling. Clearfil SE Bond (Kuraray), a mild self-etch adhesive, was used as the negative control, and One-Step (BISCO), a total-etch adhesive bonded to phosphoric acid-etched unground enamel, was used as the positive control. Differences in the thickness of enamel hybrid layers were observed and the aggressiveness of apatite dissolution in the four adhesives. |
Persistent Identifier | http://hdl.handle.net/10722/66689 |
ISSN | 2023 Impact Factor: 1.4 2023 SCImago Journal Rankings: 0.617 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tay, FR | en_HK |
dc.contributor.author | Pashley, DH | en_HK |
dc.contributor.author | King, NM | en_HK |
dc.contributor.author | Carvalho, RM | en_HK |
dc.contributor.author | Tsai, J | en_HK |
dc.contributor.author | Lai, SCN | en_HK |
dc.contributor.author | Marquezini Jr, L | en_HK |
dc.date.accessioned | 2010-09-06T05:48:29Z | - |
dc.date.available | 2010-09-06T05:48:29Z | - |
dc.date.issued | 2004 | en_HK |
dc.identifier.citation | Operative Dentistry, 2004, v. 29 n. 3, p. 309-316 | en_HK |
dc.identifier.issn | 0361-7734 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/66689 | - |
dc.description.abstract | Manufacturers of mild self-etch adhesives advocate the adjunctive use of phosphoric acid etching when bonding to unground enamel. This study tested the null hypothesis that there is no difference between the recently introduced, more aggressive self-etch adhesives and a total-etch adhesive in bonding to unground enamel. The ultrastructure and microtensile bond strengths (μTBS) of Xeno III (Dentsply) and Simplicity (Apex Dental Materials), bonded to unground enamel, were examined after thermocycling. Clearfil SE Bond (Kuraray), a mild self-etch adhesive, was used as the negative control, and One-Step (BISCO), a total-etch adhesive bonded to phosphoric acid-etched unground enamel, was used as the positive control. Differences in the thickness of enamel hybrid layers were observed and the aggressiveness of apatite dissolution in the four adhesives. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Operative Dentistry. The Journal's web site is located at http://www.jopdent.org | en_HK |
dc.relation.ispartof | Operative Dentistry | en_HK |
dc.title | Aggressiveness of self-etch adhesives on unground enamel | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0361-7734&volume=29 No3&spage=311&epage=318&date=2004&atitle=Aggressiveness+of+self-etch+adhesives+on+unground+enamel | en_HK |
dc.identifier.email | King, NM: hhdbknm@hkucc.hku.hk | en_HK |
dc.identifier.authority | King, NM=rp00006 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.pmid | 15195732 | - |
dc.identifier.scopus | eid_2-s2.0-2942582880 | en_HK |
dc.identifier.hkuros | 85854 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-2942582880&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 29 | en_HK |
dc.identifier.issue | 3 | en_HK |
dc.identifier.spage | 309 | en_HK |
dc.identifier.epage | 316 | en_HK |
dc.identifier.isi | WOS:000221412700011 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Tay, FR=7102091962 | en_HK |
dc.identifier.scopusauthorid | Pashley, DH=35448600800 | en_HK |
dc.identifier.scopusauthorid | King, NM=7201762850 | en_HK |
dc.identifier.scopusauthorid | Carvalho, RM=7103357029 | en_HK |
dc.identifier.scopusauthorid | Tsai, J=7403610711 | en_HK |
dc.identifier.scopusauthorid | Lai, SCN=7402937128 | en_HK |
dc.identifier.scopusauthorid | Marquezini Jr, L=13409944800 | en_HK |
dc.identifier.issnl | 0361-7734 | - |