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- WOS: WOS:A1982PS23700001
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Article: AUTOMATED VISUAL INSPECTION: A SURVEY.
Title | AUTOMATED VISUAL INSPECTION: A SURVEY. |
---|---|
Authors | |
Keywords | Automated visual inspection defects detection image processing industrial automation pattern recognition quality assurance |
Issue Date | 1982 |
Publisher | I E E E. The Journal's web site is located at http://www.computer.org/tpami |
Citation | Ieee Transactions On Pattern Analysis And Machine Intelligence, 1982, v. PAMI-4 n. 6, p. 557-573 How to Cite? |
Abstract | This work surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included. |
Persistent Identifier | http://hdl.handle.net/10722/65549 |
ISSN | 2023 Impact Factor: 20.8 2023 SCImago Journal Rankings: 6.158 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chin, Roland T | en_HK |
dc.contributor.author | Harlow, Charles A | en_HK |
dc.date.accessioned | 2010-08-31T07:15:17Z | - |
dc.date.available | 2010-08-31T07:15:17Z | - |
dc.date.issued | 1982 | en_HK |
dc.identifier.citation | Ieee Transactions On Pattern Analysis And Machine Intelligence, 1982, v. PAMI-4 n. 6, p. 557-573 | en_HK |
dc.identifier.issn | 0162-8828 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/65549 | - |
dc.description.abstract | This work surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included. | en_HK |
dc.language | eng | en_HK |
dc.publisher | I E E E. The Journal's web site is located at http://www.computer.org/tpami | en_HK |
dc.relation.ispartof | IEEE Transactions on Pattern Analysis and Machine Intelligence | en_HK |
dc.subject | Automated visual inspection | - |
dc.subject | defects detection | - |
dc.subject | image processing | - |
dc.subject | industrial automation | - |
dc.subject | pattern recognition | - |
dc.subject | quality assurance | - |
dc.title | AUTOMATED VISUAL INSPECTION: A SURVEY. | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Chin, Roland T: rchin@hku.hk | en_HK |
dc.identifier.authority | Chin, Roland T=rp01300 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_HK |
dc.identifier.scopus | eid_2-s2.0-0020205781 | en_HK |
dc.identifier.volume | PAMI-4 | en_HK |
dc.identifier.issue | 6 | en_HK |
dc.identifier.spage | 557 | en_HK |
dc.identifier.epage | 573 | en_HK |
dc.identifier.isi | WOS:A1982PS23700001 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Chin, Roland T=7102445426 | en_HK |
dc.identifier.scopusauthorid | Harlow, Charles A=7006051067 | en_HK |
dc.identifier.issnl | 0162-8828 | - |