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Article: AUTOMATED VISUAL INSPECTION: A SURVEY.

TitleAUTOMATED VISUAL INSPECTION: A SURVEY.
Authors
Issue Date1982
PublisherI E E E. The Journal's web site is located at http://www.computer.org/tpami
Citation
Ieee Transactions On Pattern Analysis And Machine Intelligence, 1982, v. PAMI-4 n. 6, p. 557-573 How to Cite?
AbstractThis work surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included.
Persistent Identifierhttp://hdl.handle.net/10722/65549
ISSN
2015 Impact Factor: 6.077
2015 SCImago Journal Rankings: 7.653

 

DC FieldValueLanguage
dc.contributor.authorChin, Roland Ten_HK
dc.contributor.authorHarlow, Charles Aen_HK
dc.date.accessioned2010-08-31T07:15:17Z-
dc.date.available2010-08-31T07:15:17Z-
dc.date.issued1982en_HK
dc.identifier.citationIeee Transactions On Pattern Analysis And Machine Intelligence, 1982, v. PAMI-4 n. 6, p. 557-573en_HK
dc.identifier.issn0162-8828en_HK
dc.identifier.urihttp://hdl.handle.net/10722/65549-
dc.description.abstractThis work surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included.en_HK
dc.languageengen_HK
dc.publisherI E E E. The Journal's web site is located at http://www.computer.org/tpamien_HK
dc.relation.ispartofIEEE Transactions on Pattern Analysis and Machine Intelligenceen_HK
dc.titleAUTOMATED VISUAL INSPECTION: A SURVEY.en_HK
dc.typeArticleen_HK
dc.identifier.emailChin, Roland T: rchin@hku.hken_HK
dc.identifier.authorityChin, Roland T=rp01300en_HK
dc.description.naturelink_to_subscribed_fulltexten_HK
dc.identifier.scopuseid_2-s2.0-0020205781en_HK
dc.identifier.volumePAMI-4en_HK
dc.identifier.issue6en_HK
dc.identifier.spage557en_HK
dc.identifier.epage573en_HK
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridChin, Roland T=7102445426en_HK
dc.identifier.scopusauthoridHarlow, Charles A=7006051067en_HK

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