File Download
There are no files associated with this item.
Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1117/12.956747
- Scopus: eid_2-s2.0-0018202121
- Find via
Supplementary
-
Citations:
- Scopus: 0
- Appears in Collections:
Conference Paper: Automatic Visual Inspection Of Printed Circuit Boards
Title | Automatic Visual Inspection Of Printed Circuit Boards |
---|---|
Authors | |
Keywords | AUTOMATIC TESTING IMAGE PROCESSING |
Issue Date | 1978 |
Publisher | SPIE - International Society for Optical Engineering. The Journal's web site is located at https://www.spiedigitallibrary.org/conference-proceedings-of-spie |
Citation | 22nd Annual Technical Symposium, San Diego, CA, 28-31 August 1978. In Proceedings of the Society of Photo-Optical Instrumentation Engineers, 1978, v. 155, p. 199-213 How to Cite? |
Abstract | A description of research work on the automatic visual inspection of printed circuit boards is presented as an example of a practical industrial automation problem. A programmable visual inspection system is developed applicable to PC boards and other electronic assemblies. Described methods are the dimensional verification technique and the pattern matching technique. In dimensional verification, the inspection is accomplished by verifying the dimensional accuracy of certain features of the board. In pattern matching, standard features of the board are extracted interactively. The inspection is accomplished by matching these standard features with patterns of the unit under test. |
Persistent Identifier | http://hdl.handle.net/10722/65547 |
ISSN |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chin, Roland T | en_HK |
dc.contributor.author | Harlow, Charles A | en_HK |
dc.contributor.author | Dwyer III, Samuel J | en_HK |
dc.date.accessioned | 2010-08-31T07:15:16Z | - |
dc.date.available | 2010-08-31T07:15:16Z | - |
dc.date.issued | 1978 | en_HK |
dc.identifier.citation | 22nd Annual Technical Symposium, San Diego, CA, 28-31 August 1978. In Proceedings of the Society of Photo-Optical Instrumentation Engineers, 1978, v. 155, p. 199-213 | en_HK |
dc.identifier.issn | 0361-0748 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/65547 | - |
dc.description.abstract | A description of research work on the automatic visual inspection of printed circuit boards is presented as an example of a practical industrial automation problem. A programmable visual inspection system is developed applicable to PC boards and other electronic assemblies. Described methods are the dimensional verification technique and the pattern matching technique. In dimensional verification, the inspection is accomplished by verifying the dimensional accuracy of certain features of the board. In pattern matching, standard features of the board are extracted interactively. The inspection is accomplished by matching these standard features with patterns of the unit under test. | en_HK |
dc.language | eng | en_HK |
dc.publisher | SPIE - International Society for Optical Engineering. The Journal's web site is located at https://www.spiedigitallibrary.org/conference-proceedings-of-spie | - |
dc.relation.ispartof | Proceedings of the Society of Photo-Optical Instrumentation Engineers | en_HK |
dc.subject | AUTOMATIC TESTING | en_HK |
dc.subject | IMAGE PROCESSING | en_HK |
dc.title | Automatic Visual Inspection Of Printed Circuit Boards | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Chin, Roland T: rchin@hku.hk | en_HK |
dc.identifier.authority | Chin, Roland T=rp01300 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_HK |
dc.identifier.doi | 10.1117/12.956747 | - |
dc.identifier.scopus | eid_2-s2.0-0018202121 | en_HK |
dc.identifier.volume | 155 | en_HK |
dc.identifier.spage | 199 | en_HK |
dc.identifier.epage | 213 | en_HK |
dc.identifier.scopusauthorid | Chin, Roland T=7102445426 | en_HK |
dc.identifier.scopusauthorid | Harlow, Charles A=7006051067 | en_HK |
dc.identifier.scopusauthorid | Dwyer III, Samuel J=7102571575 | en_HK |
dc.identifier.issnl | 0361-0748 | - |