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Conference Paper: How well do test case prioritization techniques support statistical fault localization
Title | How well do test case prioritization techniques support statistical fault localization |
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Authors | |
Keywords | Continuous integration Fault localization Software process integration Test case prioritization |
Issue Date | 2009 |
Publisher | IEEE. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143 |
Citation | Proceedings - International Computer Software And Applications Conference, 2009, v. 1, p. 99-106 How to Cite? |
Abstract | In continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more effectively. Statistical fault-localization techniques use the execution information collected during testing to locate faults. Executing a small fraction of a prioritized test suite reduces the cost of testing, and yet the subsequent fault localization may suffer. This paper presents the first empirical study to examine the impact of test case prioritization on the effectiveness of fault localization. Among many interesting empirical results, we find that coverage-based techniques and random ordering can be more effective than distribution-based techniques in supporting statistical fault localization. Furthermore, the integration of random ordering for test case prioritization and statistical fault localization can be effective in locating faults quickly and economically. © 2009 IEEE. |
Description | Proceedings of IEEE Annual International Computer Software and Applications Conference. This paper receives Best Paper Award from COMPSAC 2009. This research is supported in part by the General Research Fund of the Research Grants Council of Hong Kong |
Persistent Identifier | http://hdl.handle.net/10722/65463 |
ISSN | |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Jiang, B | en_HK |
dc.contributor.author | Zhang, Z | en_HK |
dc.contributor.author | Tse, TH | en_HK |
dc.contributor.author | Chen, TY | en_HK |
dc.date.accessioned | 2010-08-09T08:20:01Z | - |
dc.date.available | 2010-08-09T08:20:01Z | - |
dc.date.issued | 2009 | en_HK |
dc.identifier.citation | Proceedings - International Computer Software And Applications Conference, 2009, v. 1, p. 99-106 | en_HK |
dc.identifier.issn | 0730-3157 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/65463 | - |
dc.description | Proceedings of IEEE Annual International Computer Software and Applications Conference. | - |
dc.description | This paper receives Best Paper Award from COMPSAC 2009. This research is supported in part by the General Research Fund of the Research Grants Council of Hong Kong | - |
dc.description.abstract | In continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more effectively. Statistical fault-localization techniques use the execution information collected during testing to locate faults. Executing a small fraction of a prioritized test suite reduces the cost of testing, and yet the subsequent fault localization may suffer. This paper presents the first empirical study to examine the impact of test case prioritization on the effectiveness of fault localization. Among many interesting empirical results, we find that coverage-based techniques and random ordering can be more effective than distribution-based techniques in supporting statistical fault localization. Furthermore, the integration of random ordering for test case prioritization and statistical fault localization can be effective in locating faults quickly and economically. © 2009 IEEE. | en_HK |
dc.language | eng | - |
dc.publisher | IEEE. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143 | - |
dc.relation.ispartof | Proceedings - International Computer Software and Applications Conference | en_HK |
dc.rights | ©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Continuous integration | en_HK |
dc.subject | Fault localization | en_HK |
dc.subject | Software process integration | en_HK |
dc.subject | Test case prioritization | en_HK |
dc.title | How well do test case prioritization techniques support statistical fault localization | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0730-3157&volume=1&spage=99&epage=106&date=2009&atitle=How+well+do+test+case+prioritization+techniques+support+statistical+fault+localization+ | - |
dc.identifier.email | Tse, TH: thtse@cs.hku.hk | en_HK |
dc.identifier.authority | Tse, TH=rp00546 | en_HK |
dc.description.nature | published_or_final_version | - |
dc.identifier.doi | 10.1109/COMPSAC.2009.23 | en_HK |
dc.identifier.scopus | eid_2-s2.0-70449637968 | en_HK |
dc.identifier.hkuros | 155426 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-70449637968&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 1 | en_HK |
dc.identifier.spage | 99 | en_HK |
dc.identifier.epage | 106 | en_HK |
dc.identifier.isi | WOS:000274261400013 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Jiang, B=35199818000 | en_HK |
dc.identifier.scopusauthorid | Zhang, Z=10639502200 | en_HK |
dc.identifier.scopusauthorid | Tse, TH=7005496974 | en_HK |
dc.identifier.scopusauthorid | Chen, TY=13104290200 | en_HK |
dc.identifier.citeulike | 10413909 | - |
dc.identifier.issnl | 0730-3157 | - |