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Conference Paper: A Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope

TitleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
Authors
Issue Date2009
DescriptionInternational Conference On Materials For Advanced Technologies (icmat) 2009
Persistent Identifierhttp://hdl.handle.net/10722/62284

 

DC FieldValueLanguage
dc.contributor.authorTang, Ben_HK
dc.contributor.authorNgan, AHWen_HK
dc.date.accessioned2010-07-13T03:57:52Z-
dc.date.available2010-07-13T03:57:52Z-
dc.date.issued2009en_HK
dc.identifier.urihttp://hdl.handle.net/10722/62284-
dc.descriptionInternational Conference On Materials For Advanced Technologies (icmat) 2009en_HK
dc.languageengen_HK
dc.titleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscopeen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailTang, B: tangbin@hkucc.hku.hken_HK
dc.identifier.emailNgan, AHW: hwngan@hkucc.hku.hken_HK
dc.identifier.authorityTang, B=rp00081en_HK
dc.identifier.authorityNgan, AHW=rp00225en_HK
dc.identifier.hkuros160611en_HK

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