Conference Paper: A Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope

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TitleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
AuthorsTang, B
Ngan, AHW
Issue Date2009
DescriptionInternational Conference On Materials For Advanced Technologies (icmat) 2009
DC Field
Value
dc.contributor.authorTang, B
dc.contributor.authorNgan, AHW
dc.date.accessioned2010-07-13T03:57:52Z
dc.date.available2010-07-13T03:57:52Z
dc.date.issued2009
dc.descriptionInternational Conference On Materials For Advanced Technologies (icmat) 2009
dc.identifier.hkuros160611
dc.identifier.urihttp://hdl.handle.net/10722/62284
dc.languageeng
dc.titleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
dc.typeConference_Paper