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Conference Paper: A Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
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TitleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
 
AuthorsTang, B
Ngan, AHW
 
Issue Date2009
 
DescriptionInternational Conference On Materials For Advanced Technologies (icmat) 2009
 
DC FieldValue
dc.contributor.authorTang, B
 
dc.contributor.authorNgan, AHW
 
dc.date.accessioned2010-07-13T03:57:52Z
 
dc.date.available2010-07-13T03:57:52Z
 
dc.date.issued2009
 
dc.descriptionInternational Conference On Materials For Advanced Technologies (icmat) 2009
 
dc.identifier.hkuros160611
 
dc.identifier.urihttp://hdl.handle.net/10722/62284
 
dc.languageeng
 
dc.titleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
 
dc.typeConference_Paper
 
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<item><contributor.author>Tang, B</contributor.author>
<contributor.author>Ngan, AHW</contributor.author>
<date.accessioned>2010-07-13T03:57:52Z</date.accessioned>
<date.available>2010-07-13T03:57:52Z</date.available>
<date.issued>2009</date.issued>
<identifier.uri>http://hdl.handle.net/10722/62284</identifier.uri>
<description>International Conference On Materials For Advanced Technologies (icmat) 2009</description>
<language>eng</language>
<title>A Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope</title>
<type>Conference_Paper</type>
<identifier.hkuros>160611</identifier.hkuros>
</item>