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Conference Paper: An analytical approach to V-BLAST detection with optimal ordering for two input multiple output systems

TitleAn analytical approach to V-BLAST detection with optimal ordering for two input multiple output systems
Authors
KeywordsError propagation
Imperfect channel estimation
Optimal ordering
Symbol error probability
V-BLAST
Issue Date2008
PublisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000784
Citation
The 68th IEEE Vehicular Technology Conference (VTC 2008-Fall), Calgary Alberta, BC., 21-24 September 2008. In Proceedings of the 68th IEEE-VTC 2008-Fall, 2008, p. 1-5 How to Cite?
AbstractIn this paper, an analytical approach to performance analysis of vertical Bell laboratories layered space time (V-BLAST) detection with optimal ordering for systems with two transmit antennas is presented. The post-detection signal-to-noise-ratio (SNR) at each stage is derived and the symbol error probabilities (SEP) of the signals are then given in closed-form. The analysis takes into account the effects of optimal ordering, imperfect channel estimation and error propagation, which were rarely considered in the literature due to the difficulties in evaluation. The accuracy of the analysis is demonstrated by Monte-Carlo simulations. ©2008 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/62150
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorPeng, Wen_HK
dc.contributor.authorMa, Sen_HK
dc.contributor.authorNg, TSen_HK
dc.contributor.authorWang, Jen_HK
dc.contributor.authorAdachi, Fen_HK
dc.date.accessioned2010-07-13T03:54:54Z-
dc.date.available2010-07-13T03:54:54Z-
dc.date.issued2008en_HK
dc.identifier.citationThe 68th IEEE Vehicular Technology Conference (VTC 2008-Fall), Calgary Alberta, BC., 21-24 September 2008. In Proceedings of the 68th IEEE-VTC 2008-Fall, 2008, p. 1-5en_HK
dc.identifier.issn1550-2252en_HK
dc.identifier.urihttp://hdl.handle.net/10722/62150-
dc.description.abstractIn this paper, an analytical approach to performance analysis of vertical Bell laboratories layered space time (V-BLAST) detection with optimal ordering for systems with two transmit antennas is presented. The post-detection signal-to-noise-ratio (SNR) at each stage is derived and the symbol error probabilities (SEP) of the signals are then given in closed-form. The analysis takes into account the effects of optimal ordering, imperfect channel estimation and error propagation, which were rarely considered in the literature due to the difficulties in evaluation. The accuracy of the analysis is demonstrated by Monte-Carlo simulations. ©2008 IEEE.en_HK
dc.languageengen_HK
dc.publisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000784en_HK
dc.relation.ispartofIEEE Vehicular Technology Conferenceen_HK
dc.rightsIEEE - VTS Vehicular Technology Conference. Proceedings. Copyright © IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rights©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.subjectError propagationen_HK
dc.subjectImperfect channel estimationen_HK
dc.subjectOptimal orderingen_HK
dc.subjectSymbol error probabilityen_HK
dc.subjectV-BLASTen_HK
dc.titleAn analytical approach to V-BLAST detection with optimal ordering for two input multiple output systemsen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1550-2252&volume=&spage=&epage=&date=2008&atitle=An+analytical+approach+to+V-BLAST+detection+with+optimal+ordering+for+two+input+multiple+output+systems-
dc.identifier.emailMa, S: sdma@eee.hku.hken_HK
dc.identifier.emailNg, TS: tsng@eee.hku.hken_HK
dc.identifier.authorityMa, S=rp00153en_HK
dc.identifier.authorityNg, TS=rp00159en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/VETECF.2008.204en_HK
dc.identifier.scopuseid_2-s2.0-58149127106en_HK
dc.identifier.hkuros164631en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-58149127106&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage1-
dc.identifier.epage5-
dc.publisher.placeUnited Statesen_HK
dc.description.otherThe 68th IEEE Vehicular Technology Conference (VTC 2008-Fall), Calgary Alberta, BC., 21-24 September 2008. In Proceedings of the 68th IEEE-VTC 2008-Fall, 2008, p. 1-5-
dc.identifier.scopusauthoridPeng, W=35234313600en_HK
dc.identifier.scopusauthoridMa, S=8553949000en_HK
dc.identifier.scopusauthoridNg, TS=7402229975en_HK
dc.identifier.scopusauthoridWang, J=11439898400en_HK
dc.identifier.scopusauthoridAdachi, F=7103400688en_HK

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