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Article: TEM study of the deformation structures around nano-scratches
Title | TEM study of the deformation structures around nano-scratches |
---|---|
Authors | |
Keywords | Dislocations Focused ion-beam milling Nano-scratch Nanoidentation TEM |
Issue Date | 2008 |
Publisher | Taylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.asp |
Citation | Philosophical Magazine, 2008, v. 88 n. 9, p. 1369-1388 How to Cite? |
Abstract | An in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations. |
Persistent Identifier | http://hdl.handle.net/10722/59113 |
ISSN | 2023 Impact Factor: 1.5 2023 SCImago Journal Rankings: 0.366 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wo, PC | en_HK |
dc.contributor.author | Jones, IP | en_HK |
dc.contributor.author | Ngan, AHW | en_HK |
dc.date.accessioned | 2010-05-31T03:43:06Z | - |
dc.date.available | 2010-05-31T03:43:06Z | - |
dc.date.issued | 2008 | en_HK |
dc.identifier.citation | Philosophical Magazine, 2008, v. 88 n. 9, p. 1369-1388 | en_HK |
dc.identifier.issn | 1478-6435 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/59113 | - |
dc.description.abstract | An in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Taylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.asp | en_HK |
dc.relation.ispartof | Philosophical Magazine | en_HK |
dc.subject | Dislocations | en_HK |
dc.subject | Focused ion-beam milling | en_HK |
dc.subject | Nano-scratch | en_HK |
dc.subject | Nanoidentation | en_HK |
dc.subject | TEM | en_HK |
dc.title | TEM study of the deformation structures around nano-scratches | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Ngan, AHW:hwngan@hkucc.hku.hk | en_HK |
dc.identifier.authority | Ngan, AHW=rp00225 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1080/14786430802148999 | en_HK |
dc.identifier.scopus | eid_2-s2.0-46649119944 | en_HK |
dc.identifier.hkuros | 154692 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-46649119944&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 88 | en_HK |
dc.identifier.issue | 9 | en_HK |
dc.identifier.spage | 1369 | en_HK |
dc.identifier.epage | 1388 | en_HK |
dc.identifier.isi | WOS:000257271400007 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Wo, PC=9433530200 | en_HK |
dc.identifier.scopusauthorid | Jones, IP=34770157200 | en_HK |
dc.identifier.scopusauthorid | Ngan, AHW=7006827202 | en_HK |
dc.identifier.citeulike | 3140608 | - |
dc.identifier.issnl | 1478-6435 | - |