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Article: A method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopy

TitleA method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopy
Authors
Issue Date2008
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/nano
Citation
Nanotechnology, 2008, v. 19 n. 49 How to Cite?
AbstractA method is proposed for quantitatively measuring the elastic modulus of materials using atomic force microscopy (AFM) nanoindentation. In this method, the cantilever deformation and the tip-sample interaction during the early loading portion are treated as two springs in series, and based on Sneddon's elastic contact solution, a new cantilever-tip property α is proposed which, together with the cantilever sensitivity A, can be measured from AFM tests on two reference materials with known elastic moduli. The measured α and A values specific to the tip and machine used can then be employed to accurately measure the elastic modulus of a third sample, assuming that the tip does not get significantly plastically deformed during the calibration procedure. AFM nanoindentation tests were performed on polypropylene (PP), fused quartz and acrylic samples to verify the validity of the proposed method. The cantilever-tip property and the cantilever sensitivity measured on PP and fused quartz were 0.514 GPa and 51.99 nm nA-1, respectively. Using these measured quantities, the elastic modulus of acrylic was measured to be 3.24 GPa, which agrees well with the value measured using conventional depth-sensing indentation in a commercial nanoindenter. © IOP Publishing Ltd.
Persistent Identifierhttp://hdl.handle.net/10722/59004
ISSN
2015 Impact Factor: 3.573
2015 SCImago Journal Rankings: 1.196
ISI Accession Number ID
Funding AgencyGrant Number
Research Grants Council of the Hong Kong Special Administration Region
People's Republic of ChinaHKU 7167/05E
HKU7162/06E
Funding Information:

The Distinguished Visiting Professorship Scheme of the University of Hong Kong is gratefully acknowledged for allowing JBP to visit Hong Kong. The work described in this paper was supported by grants from the Research Grants Council of the Hong Kong Special Administration Region, People's Republic of China ( project nos. HKU 7167/05E and HKU7162/06E).

References
Grants

 

DC FieldValueLanguage
dc.contributor.authorTang, Ben_HK
dc.contributor.authorNgan, AHWen_HK
dc.contributor.authorPethica, JBen_HK
dc.date.accessioned2010-05-31T03:41:15Z-
dc.date.available2010-05-31T03:41:15Z-
dc.date.issued2008en_HK
dc.identifier.citationNanotechnology, 2008, v. 19 n. 49en_HK
dc.identifier.issn0957-4484en_HK
dc.identifier.urihttp://hdl.handle.net/10722/59004-
dc.description.abstractA method is proposed for quantitatively measuring the elastic modulus of materials using atomic force microscopy (AFM) nanoindentation. In this method, the cantilever deformation and the tip-sample interaction during the early loading portion are treated as two springs in series, and based on Sneddon's elastic contact solution, a new cantilever-tip property α is proposed which, together with the cantilever sensitivity A, can be measured from AFM tests on two reference materials with known elastic moduli. The measured α and A values specific to the tip and machine used can then be employed to accurately measure the elastic modulus of a third sample, assuming that the tip does not get significantly plastically deformed during the calibration procedure. AFM nanoindentation tests were performed on polypropylene (PP), fused quartz and acrylic samples to verify the validity of the proposed method. The cantilever-tip property and the cantilever sensitivity measured on PP and fused quartz were 0.514 GPa and 51.99 nm nA-1, respectively. Using these measured quantities, the elastic modulus of acrylic was measured to be 3.24 GPa, which agrees well with the value measured using conventional depth-sensing indentation in a commercial nanoindenter. © IOP Publishing Ltd.en_HK
dc.languageengen_HK
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/nanoen_HK
dc.relation.ispartofNanotechnologyen_HK
dc.titleA method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopyen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0957-4484&volume=19&spage=495713&epage=495719&date=2008&atitle=A+method+to+quantitatively+measure+the+elastic+modulus+of+materials+in+nanometer+scale+using+atomic+force+microscopyen_HK
dc.identifier.emailTang, B: tangbin@hkucc.hku.hken_HK
dc.identifier.emailNgan, AHW: hwngan@hkucc.hku.hken_HK
dc.identifier.authorityTang, B=rp00081en_HK
dc.identifier.authorityNgan, AHW=rp00225en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1088/0957-4484/19/49/495713en_HK
dc.identifier.scopuseid_2-s2.0-58149214071en_HK
dc.identifier.hkuros154694en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-58149214071&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume19en_HK
dc.identifier.issue49en_HK
dc.identifier.isiWOS:000261043300034-
dc.publisher.placeUnited Kingdomen_HK
dc.relation.projectEffects of Surface Adhesion on Mechanical Property Measurement of Viscoelastic Materials by Nanoindentation-
dc.identifier.scopusauthoridTang, B=24554184100en_HK
dc.identifier.scopusauthoridNgan, AHW=7006827202en_HK
dc.identifier.scopusauthoridPethica, JB=7003957401en_HK

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