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Article: Hysteresis loop collapse for linear response in magnetic-tunnel-junction sensors

TitleHysteresis loop collapse for linear response in magnetic-tunnel-junction sensors
Authors
Issue Date2009
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2009, v. 105 n. 7, article no. 07E723 How to Cite?
AbstractIn our Al2 O3 magnetic-tunnel junction (MTJ) samples that have a Neel coupling equal to or larger than their easy-axis coercivities, we found that the hysteresis loop totally collapses into a near-linear response upon rotating the easy axis of the sample off the applied field axis. A very high magnetic field sensitivity of 138%/mT (13.8%/Oe), which is among the highest reported so far, with near-linear response, was exhibited by Al2 O3 MTJs using this loop collapsing technique. This phenomenon can be explained by the switching astroid curve. In order to make this technique applicable in an actual sensor, we devised a two-step procedure whereby both easy-axis and hard-axis fields are used to accomplish the same loop collapsing effect as rotation. These result is one of the best combinations of saturation field and tunneling magnetoresistance ever achieved for MTJs, in addition to the linear nonhysteretic response at zero field that is so important for magnetic sensors. © 2009 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/58818
ISSN
2021 Impact Factor: 2.877
2020 SCImago Journal Rankings: 0.699
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorPong, PWTen_HK
dc.contributor.authorSchrag, Ben_HK
dc.contributor.authorShapiro, AJen_HK
dc.contributor.authorMcMichael, RDen_HK
dc.contributor.authorEgelhoff, WFen_HK
dc.date.accessioned2010-05-31T03:37:26Z-
dc.date.available2010-05-31T03:37:26Z-
dc.date.issued2009en_HK
dc.identifier.citationJournal of Applied Physics, 2009, v. 105 n. 7, article no. 07E723-
dc.identifier.issn0021-8979en_HK
dc.identifier.urihttp://hdl.handle.net/10722/58818-
dc.description.abstractIn our Al2 O3 magnetic-tunnel junction (MTJ) samples that have a Neel coupling equal to or larger than their easy-axis coercivities, we found that the hysteresis loop totally collapses into a near-linear response upon rotating the easy axis of the sample off the applied field axis. A very high magnetic field sensitivity of 138%/mT (13.8%/Oe), which is among the highest reported so far, with near-linear response, was exhibited by Al2 O3 MTJs using this loop collapsing technique. This phenomenon can be explained by the switching astroid curve. In order to make this technique applicable in an actual sensor, we devised a two-step procedure whereby both easy-axis and hard-axis fields are used to accomplish the same loop collapsing effect as rotation. These result is one of the best combinations of saturation field and tunneling magnetoresistance ever achieved for MTJs, in addition to the linear nonhysteretic response at zero field that is so important for magnetic sensors. © 2009 American Institute of Physics.en_HK
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_HK
dc.relation.ispartofJournal of Applied Physicsen_HK
dc.titleHysteresis loop collapse for linear response in magnetic-tunnel-junction sensorsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0021-8979&volume=105&spage=07E723&epage=&date=2009&atitle=Hysteresis+Loop+Collapse+for+Linear+Response+in+Magnetic-Tunnel-Junction+Sensorsen_HK
dc.identifier.emailPong, PWT:ppong@eee.hku.hken_HK
dc.identifier.authorityPong, PWT=rp00217en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1063/1.3076624en_HK
dc.identifier.scopuseid_2-s2.0-65249190343en_HK
dc.identifier.hkuros158645en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-65249190343&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume105en_HK
dc.identifier.issue7en_HK
dc.identifier.spagearticle no. 07E723-
dc.identifier.epagearticle no. 07E723-
dc.identifier.isiWOS:000266633500725-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridPong, PWT=24071267900en_HK
dc.identifier.scopusauthoridSchrag, B=6701780822en_HK
dc.identifier.scopusauthoridShapiro, AJ=16449846600en_HK
dc.identifier.scopusauthoridMcMichael, RD=7007083420en_HK
dc.identifier.scopusauthoridEgelhoff, WF=7006151986en_HK
dc.identifier.issnl0021-8979-

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