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Article: Reference-free machine vision inspection of semiconductor die images

TitleReference-free machine vision inspection of semiconductor die images
Authors
Issue Date2009
PublisherWorld Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/ijig/ijig.shtml
Citation
International Journal of Image and Graphics, 2009, v. 9, p. 133–152 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/58761
ISSN

 

DC FieldValueLanguage
dc.contributor.authorNg, Aen_HK
dc.contributor.authorLam, EYMen_HK
dc.contributor.authorChung, Ren_HK
dc.contributor.authorFung, Ken_HK
dc.contributor.authorLeung, Wen_HK
dc.date.accessioned2010-05-31T03:36:27Z-
dc.date.available2010-05-31T03:36:27Z-
dc.date.issued2009en_HK
dc.identifier.citationInternational Journal of Image and Graphics, 2009, v. 9, p. 133–152en_HK
dc.identifier.issn0219-4678en_HK
dc.identifier.urihttp://hdl.handle.net/10722/58761-
dc.languageengen_HK
dc.publisherWorld Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/ijig/ijig.shtmlen_HK
dc.relation.ispartofInternational Journal of Image and Graphicsen_HK
dc.titleReference-free machine vision inspection of semiconductor die imagesen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0219-4678&volume=9&spage=133–152&epage=&date=2009&atitle=Reference-free+machine+vision+inspection+of+semiconductor+die+imagesen_HK
dc.identifier.emailLam, EYM: elam@eee.hku.hken_HK
dc.identifier.authorityLam, EYM=rp00131en_HK
dc.identifier.hkuros158725en_HK

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