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Article: Thickness dependence of microstructures in La0.8Ca0.2MnO3 thin films

TitleThickness dependence of microstructures in La0.8Ca0.2MnO3 thin films
Authors
KeywordsPhysics engineering
Issue Date2006
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2006, v. 100 n. 1, article no. 013911, p. 1-4 How to Cite?
AbstractThe thickness dependence of microstructures of La0.8Ca0.2MnO3 (LCMO)/SrTiO3 (STO) thin films was investigated by high-resolution x-ray diffraction, small angle x-ray reflection, grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The results show that all the LCMO films are well oriented in (00l) direction perpendicular to the substrate surface. Self-organized crystalline grains with a tetragonal shape are uniformly distributed on the film surface, indicating the deposition condition being of benefit to the formation of the crystalline grains. With increasing the film thickness, the crystalline quality of the LCMO film is improved, while the surface becomes rougher. There exists a nondesigned cap layer on the upper surface of the LCMO layer for all the samples. The mechanism is discussed briefly.
Persistent Identifierhttp://hdl.handle.net/10722/57328
ISSN
2017 Impact Factor: 2.176
2015 SCImago Journal Rankings: 0.603
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorZhang, HDen_HK
dc.contributor.authorLi, Men_HK
dc.contributor.authorAn, YKen_HK
dc.contributor.authorMai, ZHen_HK
dc.contributor.authorGao, Jen_HK
dc.contributor.authorHu, FXen_HK
dc.contributor.authorWang, Yen_HK
dc.contributor.authorJia, CJen_HK
dc.date.accessioned2010-04-12T01:33:17Z-
dc.date.available2010-04-12T01:33:17Z-
dc.date.issued2006en_HK
dc.identifier.citationJournal of Applied Physics, 2006, v. 100 n. 1, article no. 013911, p. 1-4-
dc.identifier.issn0021-8979en_HK
dc.identifier.urihttp://hdl.handle.net/10722/57328-
dc.description.abstractThe thickness dependence of microstructures of La0.8Ca0.2MnO3 (LCMO)/SrTiO3 (STO) thin films was investigated by high-resolution x-ray diffraction, small angle x-ray reflection, grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The results show that all the LCMO films are well oriented in (00l) direction perpendicular to the substrate surface. Self-organized crystalline grains with a tetragonal shape are uniformly distributed on the film surface, indicating the deposition condition being of benefit to the formation of the crystalline grains. With increasing the film thickness, the crystalline quality of the LCMO film is improved, while the surface becomes rougher. There exists a nondesigned cap layer on the upper surface of the LCMO layer for all the samples. The mechanism is discussed briefly.en_HK
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_HK
dc.relation.ispartofJournal of Applied Physics-
dc.rightsCopyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2006, v. 100 n. 1, article no. 013911, p. 1-4 and may be found at https://doi.org/10.1063/1.2210147-
dc.subjectPhysics engineeringen_HK
dc.titleThickness dependence of microstructures in La0.8Ca0.2MnO3 thin filmsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0021-8979&volume=100&issue=1&spage=013911&epage=1 &date=2006&atitle=Thickness+dependence+of+microstructures+in+La0.8Ca0.2MnO3+thin+filmsen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.emailHu, FX: fxhu2002@hku.hken_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.2210147en_HK
dc.identifier.scopuseid_2-s2.0-33746216107-
dc.identifier.hkuros130943-
dc.identifier.volume100-
dc.identifier.issue1-
dc.identifier.spagearticle no. 013911, p. 1-
dc.identifier.epagearticle no. 013911, p. 4-
dc.identifier.isiWOS:000239056400068-

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