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Article: Thickness dependence of microstructures in La0.8Ca0.2MnO3 thin films

TitleThickness dependence of microstructures in La0.8Ca0.2MnO3 thin films
Authors
KeywordsPhysics engineering
Issue Date2006
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2006, v. 100 n. 1, p. 013911-1 - 013911-4 How to Cite?
AbstractThe thickness dependence of microstructures of La0.8Ca0.2MnO3 (LCMO)/SrTiO3 (STO) thin films was investigated by high-resolution x-ray diffraction, small angle x-ray reflection, grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The results show that all the LCMO films are well oriented in (00l) direction perpendicular to the substrate surface. Self-organized crystalline grains with a tetragonal shape are uniformly distributed on the film surface, indicating the deposition condition being of benefit to the formation of the crystalline grains. With increasing the film thickness, the crystalline quality of the LCMO film is improved, while the surface becomes rougher. There exists a nondesigned cap layer on the upper surface of the LCMO layer for all the samples. The mechanism is discussed briefly.
Persistent Identifierhttp://hdl.handle.net/10722/57328
ISSN
2015 Impact Factor: 2.101
2015 SCImago Journal Rankings: 0.603
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorZhang, HDen_HK
dc.contributor.authorLi, Men_HK
dc.contributor.authorAn, YKen_HK
dc.contributor.authorMai, ZHen_HK
dc.contributor.authorGao, Jen_HK
dc.contributor.authorHu, FXen_HK
dc.contributor.authorWang, Yen_HK
dc.contributor.authorJia, CJen_HK
dc.date.accessioned2010-04-12T01:33:17Z-
dc.date.available2010-04-12T01:33:17Z-
dc.date.issued2006en_HK
dc.identifier.citationJournal of Applied Physics, 2006, v. 100 n. 1, p. 013911-1 - 013911-4en_HK
dc.identifier.issn0021-8979en_HK
dc.identifier.urihttp://hdl.handle.net/10722/57328-
dc.description.abstractThe thickness dependence of microstructures of La0.8Ca0.2MnO3 (LCMO)/SrTiO3 (STO) thin films was investigated by high-resolution x-ray diffraction, small angle x-ray reflection, grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The results show that all the LCMO films are well oriented in (00l) direction perpendicular to the substrate surface. Self-organized crystalline grains with a tetragonal shape are uniformly distributed on the film surface, indicating the deposition condition being of benefit to the formation of the crystalline grains. With increasing the film thickness, the crystalline quality of the LCMO film is improved, while the surface becomes rougher. There exists a nondesigned cap layer on the upper surface of the LCMO layer for all the samples. The mechanism is discussed briefly.en_HK
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsJournal of Applied Physics. Copyright © American Institute of Physics.en_HK
dc.subjectPhysics engineeringen_HK
dc.titleThickness dependence of microstructures in La0.8Ca0.2MnO3 thin filmsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0021-8979&volume=100&issue=1&spage=013911&epage=1 &date=2006&atitle=Thickness+dependence+of+microstructures+in+La0.8Ca0.2MnO3+thin+filmsen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.emailHu, FX: fxhu2002@hku.hken_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.2210147en_HK
dc.identifier.scopuseid_2-s2.0-33746216107-
dc.identifier.hkuros130943-
dc.identifier.isiWOS:000239056400068-

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