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postgraduate thesis: Some experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiC

TitleSome experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiC
Authors
Issue Date2001
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Chen, X. [陳旭東]. (2001). Some experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiC. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b4257674
DegreeDoctor of Philosophy
SubjectNeutron irradiation.
Metal oxide semiconductors.
Beryllium.
Dept/ProgramPhysics
Persistent Identifierhttp://hdl.handle.net/10722/55691
HKU Library Item IDb4257674

 

DC FieldValueLanguage
dc.contributor.authorChen, Xudong.-
dc.contributor.author陳旭東-
dc.date.issued2001-
dc.identifier.citationChen, X. [陳旭東]. (2001). Some experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiC. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b4257674-
dc.identifier.urihttp://hdl.handle.net/10722/55691-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.source.urihttp://hub.hku.hk/bib/B4257674X-
dc.subject.lcshNeutron irradiation.-
dc.subject.lcshMetal oxide semiconductors.-
dc.subject.lcshBeryllium.-
dc.titleSome experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiC-
dc.typePG_Thesis-
dc.identifier.hkulb4257674-
dc.description.thesisnameDoctor of Philosophy-
dc.description.thesislevelDoctoral-
dc.description.thesisdisciplinePhysics-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b4257674-
dc.date.hkucongregation2002-
dc.identifier.mmsid991027293909703414-

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