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Conference Paper: Fault propagation in tabular expression-based specifications
Title | Fault propagation in tabular expression-based specifications |
---|---|
Authors | |
Keywords | Fault propagation tracing Fault-based testing technique Formal specification |
Issue Date | 2008 |
Publisher | Institute of Electrical and Electronics Engineers. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143 |
Citation | The 32nd Annual IEEE International Computer Software and Applications Conference (COMPSAC 2008), Turku, Finland, 28 July-1 August 2008. In Conference Proceedings, 2008, p. 180-183 How to Cite? |
Abstract | Tabular expressions have been used in industry for many years to precisely document software in a readable notation.
In this paper, we propose a fault-based testing technique that traces the propagation of faults from the expression
in each cell of a tabular expression to the output of the program under test. The technique has been formalized in the form of abstract test case constraints also represented by tabular expressions, so that it can be easily applied and automated. |
Persistent Identifier | http://hdl.handle.net/10722/55041 |
ISSN | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Feng, X | - |
dc.contributor.author | Parnas, DL | - |
dc.contributor.author | Tse, TH | - |
dc.date.accessioned | 2009-07-14T04:57:55Z | - |
dc.date.available | 2009-07-14T04:57:55Z | - |
dc.date.issued | 2008 | - |
dc.identifier.citation | The 32nd Annual IEEE International Computer Software and Applications Conference (COMPSAC 2008), Turku, Finland, 28 July-1 August 2008. In Conference Proceedings, 2008, p. 180-183 | - |
dc.identifier.issn | 0730-3157 | - |
dc.identifier.uri | http://hdl.handle.net/10722/55041 | - |
dc.description.abstract | Tabular expressions have been used in industry for many years to precisely document software in a readable notation. In this paper, we propose a fault-based testing technique that traces the propagation of faults from the expression in each cell of a tabular expression to the output of the program under test. The technique has been formalized in the form of abstract test case constraints also represented by tabular expressions, so that it can be easily applied and automated. | en |
dc.language | eng | - |
dc.language.iso | eng | en |
dc.publisher | Institute of Electrical and Electronics Engineers. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143 | - |
dc.relation.ispartof | IEEE International Computer Software and Applications Conference Proceedings | - |
dc.rights | ©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Fault propagation tracing | en |
dc.subject | Fault-based testing technique | en |
dc.subject | Formal specification | en |
dc.title | Fault propagation in tabular expression-based specifications | - |
dc.type | Conference_Paper | - |
dc.identifier.email | Tse, TH: thtse@cs.hku.hk | - |
dc.identifier.authority | Tse, TH=rp00546 | - |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/COMPSAC.2008.115 | - |
dc.identifier.scopus | eid_2-s2.0-51949104778 | - |
dc.identifier.hkuros | 141677 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-51949104778&selection=ref&src=s&origin=recordpage | - |
dc.identifier.spage | 180 | - |
dc.identifier.epage | 183 | - |
dc.publisher.place | United States | - |
dc.identifier.scopusauthorid | Feng, X=55224956000 | - |
dc.identifier.scopusauthorid | Parnas, DL=7006616905 | - |
dc.identifier.scopusauthorid | Tse, TH=7005496974 | - |
dc.customcontrol.immutable | sml 161007 - amended | - |
dc.identifier.issnl | 0730-3157 | - |