File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

postgraduate thesis: Studies of electron irradiation induced deep level defects in p-type 6H-SIC

TitleStudies of electron irradiation induced deep level defects in p-type 6H-SIC
Authors
Advisors
Issue Date2009
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Luo, J. [羅佳明]. (2009). Studies of electron irradiation induced deep level defects in p-type 6H-SIC. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b4175815
DegreeMaster of Philosophy
SubjectSilicon carbide - Defects.
Deep level transient spectroscopy.
Dept/ProgramPhysics
Persistent Identifierhttp://hdl.handle.net/10722/54660
HKU Library Item IDb4175815

 

DC FieldValueLanguage
dc.contributor.advisorFung, SHY-
dc.contributor.advisorLing, FCC-
dc.contributor.authorLuo, Jiaming-
dc.contributor.author羅佳明-
dc.date.issued2009-
dc.identifier.citationLuo, J. [羅佳明]. (2009). Studies of electron irradiation induced deep level defects in p-type 6H-SIC. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b4175815-
dc.identifier.urihttp://hdl.handle.net/10722/54660-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.source.urihttp://hub.hku.hk/bib/B41758158-
dc.subject.lcshSilicon carbide - Defects.-
dc.subject.lcshDeep level transient spectroscopy.-
dc.titleStudies of electron irradiation induced deep level defects in p-type 6H-SIC-
dc.typePG_Thesis-
dc.identifier.hkulb4175815-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplinePhysics-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b4175815-
dc.date.hkucongregation2009-
dc.identifier.mmsid991024845469703414-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats