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postgraduate thesis: Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy
Title | Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy |
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Authors | |
Advisors | Advisor(s):Wu, HS |
Issue Date | 2005 |
Publisher | The University of Hong Kong (Pokfulam, Hong Kong) |
Citation | Ma, K. S. [馬勁民]. (2005). Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3653752 |
Degree | Doctor of Philosophy |
Subject | Gallium nitride Low energy electron diffraction. Semiconductor wafers. Molecular beam epitaxy. |
Dept/Program | Physics |
Persistent Identifier | http://hdl.handle.net/10722/52386 |
HKU Library Item ID | b3653752 |
DC Field | Value | Language |
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dc.contributor.advisor | Wu, HS | - |
dc.contributor.author | Ma, King-man, Simon. | - |
dc.contributor.author | 馬勁民. | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | Ma, K. S. [馬勁民]. (2005). Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3653752 | - |
dc.identifier.uri | http://hdl.handle.net/10722/52386 | - |
dc.language | eng | - |
dc.publisher | The University of Hong Kong (Pokfulam, Hong Kong) | - |
dc.relation.ispartof | HKU Theses Online (HKUTO) | - |
dc.rights | The author retains all proprietary rights, (such as patent rights) and the right to use in future works. | - |
dc.rights | This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License. | - |
dc.source.uri | http://hub.hku.hk/bib/B36537524 | - |
dc.subject.lcsh | Gallium nitride | - |
dc.subject.lcsh | Low energy electron diffraction. | - |
dc.subject.lcsh | Semiconductor wafers. | - |
dc.subject.lcsh | Molecular beam epitaxy. | - |
dc.title | Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy | - |
dc.type | PG_Thesis | - |
dc.identifier.hkul | b3653752 | - |
dc.description.thesisname | Doctor of Philosophy | - |
dc.description.thesislevel | Doctoral | - |
dc.description.thesisdiscipline | Physics | - |
dc.description.nature | published_or_final_version | - |
dc.description.nature | abstract | - |
dc.identifier.doi | 10.5353/th_b3653752 | - |
dc.date.hkucongregation | 2006 | - |
dc.identifier.mmsid | 991017843469703414 | - |