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Conference Paper: On the completeness of test cases for atomic arithmetic expressions

TitleOn the completeness of test cases for atomic arithmetic expressions
Authors
KeywordsArithmetic expressions
completeness of test cases
mutation operators
mutation testing
software testing
Issue Date2000
PublisherIEEE Computer Society.
Citation
The 1st Asia-Pacific Conference on Quality Software Proceedings, Hong Kong, China, 30-31 October 2000, p. 149-155 How to Cite?
AbstractMost research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary
Persistent Identifierhttp://hdl.handle.net/10722/48437

 

DC FieldValueLanguage
dc.contributor.authorTse, THen_HK
dc.contributor.authorChen, TYen_HK
dc.contributor.authorFeng, Xen_HK
dc.date.accessioned2008-05-22T04:13:00Z-
dc.date.available2008-05-22T04:13:00Z-
dc.date.issued2000en_HK
dc.identifier.citationThe 1st Asia-Pacific Conference on Quality Software Proceedings, Hong Kong, China, 30-31 October 2000, p. 149-155en_HK
dc.identifier.urihttp://hdl.handle.net/10722/48437-
dc.description.abstractMost research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessaryen_HK
dc.format.extent466782 bytes-
dc.format.extent783 bytes-
dc.format.extent783 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherIEEE Computer Society.en_HK
dc.relation.ispartofAsia-Pacific Conference on Quality Software Proceedings-
dc.rights©2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectArithmetic expressionsen_HK
dc.subjectcompleteness of test casesen_HK
dc.subjectmutation operatorsen_HK
dc.subjectmutation testingen_HK
dc.subjectsoftware testingen_HK
dc.titleOn the completeness of test cases for atomic arithmetic expressionsen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailTse, TH: thtse@cs.hku.hken_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1109/APAQ.2000.883788en_HK
dc.identifier.hkuros56492-

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