File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Conference Paper: Design and implementation of a real-time positron imager

TitleDesign and implementation of a real-time positron imager
Authors
KeywordsDefect profiling
Optimal time
Positron annihilation spectroscopy
Positron beam
Real-time imaging
Resolution switching
S-parameter
User-friendly
White-noise
Issue Date2004
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Citation
Real-Time Imaging VIII, San Jose, California, USA, 20-22 January 2004, v. 5297, p. 294-298 How to Cite?
AbstractIn this paper we are going to present the first real-time S-parameter positron imager. This is a useful tool in solid state technology for mapping the lateral defect types and concentrations on a material sample. This technology has been developed for two major categories of researchers, the first being those that have a focused low energy positron beam and second those that do not. Here we describe the design and implementation of a real-time automated scanning system that rasters a sample surface with a 0.5mm diameter positron source (or beam focus) so as to give an S-parameter image of a sample. The source (or beam) rasters across a region of a semiconductor sample in rectilinear motion while gamma ray energies E γ are processed using a standard HP Ge spectroscopy system and a 14 bit nuclear ADC. Two other ADCs are used to obtain the x, y coordinate data corresponding to each event by storing voltage pulses from the x & y stepper motor drives (or saddle coil currents) gated with the event pulses. Using these event data triplets (x, y, E γ) the S-parameter is computed in real time for each pixel region and is used to refresh a color image display on the screen coordinates. Optimal use is made of processing time and the system resources. This user-friendly system is efficient for producing high resolution S-parameter images of the sample, (patent pending 2003).
Persistent Identifierhttp://hdl.handle.net/10722/47045
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorNaik, PSen_HK
dc.contributor.authorBeling, CDen_HK
dc.contributor.authorFung, Sen_HK
dc.date.accessioned2007-10-30T07:05:12Z-
dc.date.available2007-10-30T07:05:12Z-
dc.date.issued2004en_HK
dc.identifier.citationReal-Time Imaging VIII, San Jose, California, USA, 20-22 January 2004, v. 5297, p. 294-298en_HK
dc.identifier.issn0277-786Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/47045-
dc.description.abstractIn this paper we are going to present the first real-time S-parameter positron imager. This is a useful tool in solid state technology for mapping the lateral defect types and concentrations on a material sample. This technology has been developed for two major categories of researchers, the first being those that have a focused low energy positron beam and second those that do not. Here we describe the design and implementation of a real-time automated scanning system that rasters a sample surface with a 0.5mm diameter positron source (or beam focus) so as to give an S-parameter image of a sample. The source (or beam) rasters across a region of a semiconductor sample in rectilinear motion while gamma ray energies E γ are processed using a standard HP Ge spectroscopy system and a 14 bit nuclear ADC. Two other ADCs are used to obtain the x, y coordinate data corresponding to each event by storing voltage pulses from the x & y stepper motor drives (or saddle coil currents) gated with the event pulses. Using these event data triplets (x, y, E γ) the S-parameter is computed in real time for each pixel region and is used to refresh a color image display on the screen coordinates. Optimal use is made of processing time and the system resources. This user-friendly system is efficient for producing high resolution S-parameter images of the sample, (patent pending 2003).en_HK
dc.format.extent300407 bytes-
dc.format.extent13983 bytes-
dc.format.extent5932 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xmlen_HK
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_HK
dc.rightsS P I E - the International Society for Optical Proceedings. Copyright © S P I E - International Society for Optical Engineering.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsCopyright 2004 Society of Photo-Optical Instrumentation Engineers. This paper was published in Real-Time Imaging VIII, San Jose, California, USA, 20-22 January 2004, v. 5297, p. 294-298 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.en_HK
dc.subjectDefect profilingen_HK
dc.subjectOptimal timeen_HK
dc.subjectPositron annihilation spectroscopyen_HK
dc.subjectPositron beamen_HK
dc.subjectReal-time imagingen_HK
dc.subjectResolution switchingen_HK
dc.subjectS-parameteren_HK
dc.subjectUser-friendlyen_HK
dc.subjectWhite-noiseen_HK
dc.titleDesign and implementation of a real-time positron imageren_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0277-786X&volume=5297&spage=294&epage=298&date=2004&atitle=Design+and+implementation+of+a+real-time+positron+imageren_HK
dc.identifier.emailBeling, CD: cdbeling@hkucc.hku.hken_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.authorityBeling, CD=rp00660en_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1117/12.543925en_HK
dc.identifier.scopuseid_2-s2.0-8844276154en_HK
dc.identifier.hkuros94986-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-8844276154&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume5297en_HK
dc.identifier.spage294en_HK
dc.identifier.epage298en_HK
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridNaik, PS=8451851900en_HK
dc.identifier.scopusauthoridBeling, CD=7005864180en_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats