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Conference Paper: Deep level transient spectroscopy study of particle irradiation induced defects in n-6H-SiC (Abstract)

TitleDeep level transient spectroscopy study of particle irradiation induced defects in n-6H-SiC (Abstract)
Authors
KeywordsPhysics
Issue Date2004
PublisherAmerican Physical Society. The Journal's web site is located at http://www.aps.org/memb/guide/prbook-baps.cfm
Citation
The 2004 March Meeting of the American Physical Society, Montreal, QC., Canada, 22-26 March 2004. In American Physical Society Bulletin, 2004, v. 49, p. 534 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/47042
ISSN

 

DC FieldValueLanguage
dc.contributor.authorChen, XDen_HK
dc.contributor.authorGong, Men_HK
dc.contributor.authorFung, SHYen_HK
dc.contributor.authorBeling, CDen_HK
dc.contributor.authorLing, FCCen_HK
dc.date.accessioned2007-10-30T07:05:08Z-
dc.date.available2007-10-30T07:05:08Z-
dc.date.issued2004en_HK
dc.identifier.citationThe 2004 March Meeting of the American Physical Society, Montreal, QC., Canada, 22-26 March 2004. In American Physical Society Bulletin, 2004, v. 49, p. 534en_HK
dc.identifier.issn0003-0503en_HK
dc.identifier.urihttp://hdl.handle.net/10722/47042-
dc.format.extent338538 bytes-
dc.format.extent1036577 bytes-
dc.format.extent5932 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherAmerican Physical Society. The Journal's web site is located at http://www.aps.org/memb/guide/prbook-baps.cfmen_HK
dc.relation.ispartofAmerican Physical Society Bulletin-
dc.rightsAmerican Physical Society Bulletin. Copyright © American Physical Society.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectPhysicsen_HK
dc.titleDeep level transient spectroscopy study of particle irradiation induced defects in n-6H-SiC (Abstract)en_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-0503&volume=49&spage=534&epage=&date=2004&atitle=Deep+level+transient+spectroscopy+study+of+particle+irradiation+induced+defects+in+n-6H-SiC+(Abstract)en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.hkuros85836-

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