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Conference Paper: Defect detection on patterned jacquard fabric

TitleDefect detection on patterned jacquard fabric
Authors
KeywordsComputers
Electronic data processing
Issue Date2003
PublisherIEEE, Computer Society.
Citation
The 32nd Applied Imagery Pattern Recognition Workshop, Washington, DC., 15-17 October 2003. In Conference Proceedings, 2003, p. 163-168 How to Cite?
AbstractThe techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.
Persistent Identifierhttp://hdl.handle.net/10722/46407
ISSN

 

DC FieldValueLanguage
dc.contributor.authorNgan, YTen_HK
dc.contributor.authorPang, GKHen_HK
dc.contributor.authorYung, SPen_HK
dc.contributor.authorNg, KPen_HK
dc.date.accessioned2007-10-30T06:49:13Z-
dc.date.available2007-10-30T06:49:13Z-
dc.date.issued2003en_HK
dc.identifier.citationThe 32nd Applied Imagery Pattern Recognition Workshop, Washington, DC., 15-17 October 2003. In Conference Proceedings, 2003, p. 163-168en_HK
dc.identifier.issn1550-5219en_HK
dc.identifier.urihttp://hdl.handle.net/10722/46407-
dc.description.abstractThe techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.en_HK
dc.format.extent2754623 bytes-
dc.format.extent4353 bytes-
dc.format.extent4654 bytes-
dc.format.extent2365 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.format.mimetypetext/plain-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherIEEE, Computer Society.en_HK
dc.relation.ispartofApplied Imagery Pattern Recognition Workshop-
dc.rights©2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectComputersen_HK
dc.subjectElectronic data processingen_HK
dc.titleDefect detection on patterned jacquard fabricen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1550-5219&volume=&spage=163&epage=168&date=2003&atitle=Defect+detection+on+patterned+jacquard+fabricen_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1109/AIPR.2003.1284266en_HK
dc.identifier.hkuros88944-

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