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Conference Paper: A method to measure EMI due to electric field coupling on PCB

TitleA method to measure EMI due to electric field coupling on PCB
Authors
Pong, BMHLee, ACM
Issue Date1997
PublisherIEEE.
Citation
Proceedings of the 1997 Power Conversion Conference, Nagaoka, Japan, 3-6 August 1997, v. 2, p. 1007-1012 How to Cite?
DOI: http://dx.doi.org/10.1109/PCCON.1997.638393
AbstractA new method to measure electric field coupling between PCB copper traces is presented. This method enables measurement of noise from waveforms obtainable from breadboard prototypes, which is available in an early stage in the design process. The measurement result can then be analyzed and provide information for further PCB design. This method is verified by experiments and applied to an off-line flyback converter.
Persistent Identifierhttp://hdl.handle.net/10722/46072
ISBN
0-7803-3823-5
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorPong, BMHen_HK
dc.contributor.authorLee, ACMen_HK
dc.date.accessioned2007-10-30T06:41:56Z-
dc.date.available2007-10-30T06:41:56Z-
dc.date.issued1997en_HK
dc.identifier.citationProceedings of the 1997 Power Conversion Conference, Nagaoka, Japan, 3-6 August 1997, v. 2, p. 1007-1012en_HK
dc.identifier.isbn0-7803-3823-5en_HK
dc.identifier.urihttp://hdl.handle.net/10722/46072-
dc.description.abstractA new method to measure electric field coupling between PCB copper traces is presented. This method enables measurement of noise from waveforms obtainable from breadboard prototypes, which is available in an early stage in the design process. The measurement result can then be analyzed and provide information for further PCB design. This method is verified by experiments and applied to an off-line flyback converter.en_HK
dc.format.extent502888 bytes-
dc.format.extent9923 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherIEEE.en_HK
dc.relation.ispartofProceedings of the 1997 Power Conversion Conference-
dc.rights©1997 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.titleA method to measure EMI due to electric field coupling on PCBen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0-7803-3823-5&volume=2&spage=1007&epage=1012&date=1997&atitle=A+method+to+measure+EMI+due+to+electric+field+coupling+on+PCBen_HK
dc.identifier.emailPong, BMH: mhp@eee.hku.hk-
dc.identifier.authorityPong, BMH=rp00163-
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1109/PCCON.1997.638393en_HK
dc.identifier.scopuseid_2-s2.0-0031366018-
dc.identifier.hkuros37075-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0031366018&selection=ref&src=s&origin=recordpage-
dc.identifier.volume2-
dc.identifier.spage1007-
dc.identifier.epage1012-
dc.identifier.scopusauthoridPong, Bryan MH=7003449364-
dc.identifier.scopusauthoridLee, Angus CM=7405627588-
dc.customcontrol.immutablesml 160112 - merged-

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