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Article: Study of laser-debonded GaN LEDs
Title | Study of laser-debonded GaN LEDs |
---|---|
Authors | |
Keywords | Gallium nitride Hexagonal pyramid Laser debonding Light emitting diodes Low-frequency noise Roughening |
Issue Date | 2006 |
Publisher | I E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16 |
Citation | Ieee Transactions On Electron Devices, 2006, v. 53 n. 9, p. 2266-2271 How to Cite? |
Abstract | Detailed investigations of laser-debonded GaN-based light-emitting diodes (LEDs) grown by metal-organic chemical vapor deposition (MOCVD) on sapphire substrates were reported. The debonded surface was roughened by photoelectrochemical (PEC) etching in a mixture of potassium hydroxide (KOH) and peroxydisulfate (K 2S 2O 8) solution. The power for the laser-assisted debonding process has been systematically optimized. The data show that as long as the laser power does not exceed the optimal value, there is no degradation in the current-voltage (I-V) characteristics, the brightness, as well as the low-frequency noise properties of the devices. The roughness of the debonded surface is systematically varied using different etching times. Experimental results demonstrate strong dependencies of the luminous intensity of the device on the roughness of the debonded surface. A 60% improvement in the luminous intensity of the debonded and roughened LED compared to the original on-sapphire device was observed. This increase in the extraction efficiency is attributed to the reduction in the total internal reflection at the roughened GaN/air interface. © 2006 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/45279 |
ISSN | 2023 Impact Factor: 2.9 2023 SCImago Journal Rankings: 0.785 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, CP | en_HK |
dc.contributor.author | Gao, J | en_HK |
dc.contributor.author | Yue, TM | en_HK |
dc.contributor.author | Surya, C | en_HK |
dc.contributor.author | Ng, AMC | en_HK |
dc.contributor.author | Djurišić, AB | en_HK |
dc.contributor.author | Liu, PCK | en_HK |
dc.contributor.author | Li, M | en_HK |
dc.date.accessioned | 2007-10-30T06:21:36Z | - |
dc.date.available | 2007-10-30T06:21:36Z | - |
dc.date.issued | 2006 | en_HK |
dc.identifier.citation | Ieee Transactions On Electron Devices, 2006, v. 53 n. 9, p. 2266-2271 | en_HK |
dc.identifier.issn | 0018-9383 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/45279 | - |
dc.description.abstract | Detailed investigations of laser-debonded GaN-based light-emitting diodes (LEDs) grown by metal-organic chemical vapor deposition (MOCVD) on sapphire substrates were reported. The debonded surface was roughened by photoelectrochemical (PEC) etching in a mixture of potassium hydroxide (KOH) and peroxydisulfate (K 2S 2O 8) solution. The power for the laser-assisted debonding process has been systematically optimized. The data show that as long as the laser power does not exceed the optimal value, there is no degradation in the current-voltage (I-V) characteristics, the brightness, as well as the low-frequency noise properties of the devices. The roughness of the debonded surface is systematically varied using different etching times. Experimental results demonstrate strong dependencies of the luminous intensity of the device on the roughness of the debonded surface. A 60% improvement in the luminous intensity of the debonded and roughened LED compared to the original on-sapphire device was observed. This increase in the extraction efficiency is attributed to the reduction in the total internal reflection at the roughened GaN/air interface. © 2006 IEEE. | en_HK |
dc.format.extent | 411339 bytes | - |
dc.format.extent | 3553 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | text/plain | - |
dc.language | eng | en_HK |
dc.publisher | I E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16 | en_HK |
dc.relation.ispartof | IEEE Transactions on Electron Devices | en_HK |
dc.rights | ©2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Gallium nitride | en_HK |
dc.subject | Hexagonal pyramid | en_HK |
dc.subject | Laser debonding | en_HK |
dc.subject | Light emitting diodes | en_HK |
dc.subject | Low-frequency noise | en_HK |
dc.subject | Roughening | en_HK |
dc.title | Study of laser-debonded GaN LEDs | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0018-9383&volume=53&issue=9&spage=2266&epage=2272&date=2006&atitle=Study+of+Laser-Debonded+GaN+LEDs | en_HK |
dc.identifier.email | Djurišić, AB: dalek@hku.hk | en_HK |
dc.identifier.authority | Djurišić, AB=rp00690 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/TED.2006.881008 | en_HK |
dc.identifier.scopus | eid_2-s2.0-33947188538 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-33947188538&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 53 | en_HK |
dc.identifier.issue | 9 | en_HK |
dc.identifier.spage | 2266 | en_HK |
dc.identifier.epage | 2271 | en_HK |
dc.identifier.isi | WOS:000240076500035 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Chan, CP=7404814427 | en_HK |
dc.identifier.scopusauthorid | Gao, J=34770762800 | en_HK |
dc.identifier.scopusauthorid | Yue, TM=7101867231 | en_HK |
dc.identifier.scopusauthorid | Surya, C=7003939256 | en_HK |
dc.identifier.scopusauthorid | Ng, AMC=12140078600 | en_HK |
dc.identifier.scopusauthorid | Djurišić, AB=7004904830 | en_HK |
dc.identifier.scopusauthorid | Liu, PCK=53873054700 | en_HK |
dc.identifier.scopusauthorid | Li, M=26643642600 | en_HK |
dc.identifier.issnl | 0018-9383 | - |