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Article: Novel method for patterned fabric inspection using Bollinger bands
Title | Novel method for patterned fabric inspection using Bollinger bands |
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Authors | |
Keywords | Bollinger bands Defect detection Patterned fabric inspection Texture analysis |
Issue Date | 2006 |
Publisher | S P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe |
Citation | Optical Engineering, 2006, v. 45 n. 8, article no. 087202 How to Cite? |
Abstract | This paper introduces a new application of Bollinger bands for defect detection of patterned fabric. A literature review on previous designed methods for patterned fabric defect detection will be depicted. For data analysis, Bollinger bands are calculated based on standard deviation and are originally used in the financial market as an oversold or overbought indicator for stock. The Bollinger bands method is an efficient, fast and shift-invariant approach, that can segment out the defective regions on the patterned fabric with clear and crystal clean images. The new approach is immune of the alignment problem that often happens in previous methods. In this paper, the upper band and lower band of Bollinger bands, which are sensitive to any subtle change in the input data, have been developed for use to indicate the defective areas in patterned fabric. The number of standard deviation and length of time of Bollinger bands can be easily determined to obtain excellent detection results. The proposed method has been evaluated on three different patterned fabrics. In total, 165 defect-free and 171 defective images have been used in the evaluation, where 98.59% accuracy on inspection has been achieved. © 2006 Society of Photo-Optical Instrumentation Engineers. |
Persistent Identifier | http://hdl.handle.net/10722/44829 |
ISSN | 2023 Impact Factor: 1.1 2023 SCImago Journal Rankings: 0.331 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Ngan, HYT | en_HK |
dc.contributor.author | Pang, GKH | en_HK |
dc.date.accessioned | 2007-10-30T06:11:08Z | - |
dc.date.available | 2007-10-30T06:11:08Z | - |
dc.date.issued | 2006 | en_HK |
dc.identifier.citation | Optical Engineering, 2006, v. 45 n. 8, article no. 087202 | en_HK |
dc.identifier.issn | 0091-3286 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/44829 | - |
dc.description.abstract | This paper introduces a new application of Bollinger bands for defect detection of patterned fabric. A literature review on previous designed methods for patterned fabric defect detection will be depicted. For data analysis, Bollinger bands are calculated based on standard deviation and are originally used in the financial market as an oversold or overbought indicator for stock. The Bollinger bands method is an efficient, fast and shift-invariant approach, that can segment out the defective regions on the patterned fabric with clear and crystal clean images. The new approach is immune of the alignment problem that often happens in previous methods. In this paper, the upper band and lower band of Bollinger bands, which are sensitive to any subtle change in the input data, have been developed for use to indicate the defective areas in patterned fabric. The number of standard deviation and length of time of Bollinger bands can be easily determined to obtain excellent detection results. The proposed method has been evaluated on three different patterned fabrics. In total, 165 defect-free and 171 defective images have been used in the evaluation, where 98.59% accuracy on inspection has been achieved. © 2006 Society of Photo-Optical Instrumentation Engineers. | en_HK |
dc.format.extent | 2402819 bytes | - |
dc.format.extent | 4651 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | text/plain | - |
dc.language | eng | en_HK |
dc.publisher | S P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe | en_HK |
dc.relation.ispartof | Optical Engineering | en_HK |
dc.rights | Copyright 2006 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. This article is available online at https://doi.org/10.1117/1.2345189 | - |
dc.subject | Bollinger bands | en_HK |
dc.subject | Defect detection | en_HK |
dc.subject | Patterned fabric inspection | en_HK |
dc.subject | Texture analysis | en_HK |
dc.title | Novel method for patterned fabric inspection using Bollinger bands | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Pang, GKH:gpang@eee.hku.hk | en_HK |
dc.identifier.authority | Pang, GKH=rp00162 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1117/1.2345189 | en_HK |
dc.identifier.scopus | eid_2-s2.0-34547649432 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-34547649432&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 45 | en_HK |
dc.identifier.issue | 8 | en_HK |
dc.identifier.spage | article no. 087202 | - |
dc.identifier.epage | article no. 087202 | - |
dc.identifier.isi | WOS:000241162100046 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Ngan, HYT=7102173824 | en_HK |
dc.identifier.scopusauthorid | Pang, GKH=7103393283 | en_HK |
dc.identifier.issnl | 0091-3286 | - |