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Article: Novel method for patterned fabric inspection using Bollinger bands

TitleNovel method for patterned fabric inspection using Bollinger bands
Authors
KeywordsBollinger bands
Defect detection
Patterned fabric inspection
Texture analysis
Issue Date2006
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe
Citation
Optical Engineering, 2006, v. 45 n. 8 How to Cite?
AbstractThis paper introduces a new application of Bollinger bands for defect detection of patterned fabric. A literature review on previous designed methods for patterned fabric defect detection will be depicted. For data analysis, Bollinger bands are calculated based on standard deviation and are originally used in the financial market as an oversold or overbought indicator for stock. The Bollinger bands method is an efficient, fast and shift-invariant approach, that can segment out the defective regions on the patterned fabric with clear and crystal clean images. The new approach is immune of the alignment problem that often happens in previous methods. In this paper, the upper band and lower band of Bollinger bands, which are sensitive to any subtle change in the input data, have been developed for use to indicate the defective areas in patterned fabric. The number of standard deviation and length of time of Bollinger bands can be easily determined to obtain excellent detection results. The proposed method has been evaluated on three different patterned fabrics. In total, 165 defect-free and 171 defective images have been used in the evaluation, where 98.59% accuracy on inspection has been achieved. © 2006 Society of Photo-Optical Instrumentation Engineers.
Persistent Identifierhttp://hdl.handle.net/10722/44829
ISSN
2015 Impact Factor: 0.984
2015 SCImago Journal Rankings: 0.485
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorNgan, HYTen_HK
dc.contributor.authorPang, GKHen_HK
dc.date.accessioned2007-10-30T06:11:08Z-
dc.date.available2007-10-30T06:11:08Z-
dc.date.issued2006en_HK
dc.identifier.citationOptical Engineering, 2006, v. 45 n. 8en_HK
dc.identifier.issn0091-3286en_HK
dc.identifier.urihttp://hdl.handle.net/10722/44829-
dc.description.abstractThis paper introduces a new application of Bollinger bands for defect detection of patterned fabric. A literature review on previous designed methods for patterned fabric defect detection will be depicted. For data analysis, Bollinger bands are calculated based on standard deviation and are originally used in the financial market as an oversold or overbought indicator for stock. The Bollinger bands method is an efficient, fast and shift-invariant approach, that can segment out the defective regions on the patterned fabric with clear and crystal clean images. The new approach is immune of the alignment problem that often happens in previous methods. In this paper, the upper band and lower band of Bollinger bands, which are sensitive to any subtle change in the input data, have been developed for use to indicate the defective areas in patterned fabric. The number of standard deviation and length of time of Bollinger bands can be easily determined to obtain excellent detection results. The proposed method has been evaluated on three different patterned fabrics. In total, 165 defect-free and 171 defective images have been used in the evaluation, where 98.59% accuracy on inspection has been achieved. © 2006 Society of Photo-Optical Instrumentation Engineers.en_HK
dc.format.extent2402819 bytes-
dc.format.extent4651 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oeen_HK
dc.relation.ispartofOptical Engineeringen_HK
dc.rightsOptical Engineering. Copyright © S P I E - International Society for Optical Engineering.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsCopyright 2006 Society of Photo-Optical Instrumentation Engineers. This paper was published in Optical Engineering, 2006, v. 45 n. 8, p. 087202:1-15 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.en_HK
dc.subjectBollinger bandsen_HK
dc.subjectDefect detectionen_HK
dc.subjectPatterned fabric inspectionen_HK
dc.subjectTexture analysisen_HK
dc.titleNovel method for patterned fabric inspection using Bollinger bandsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0091-3286&volume=45&issue=8&spage=087202:1&epage=15&date=2006&atitle=Novel+method+for+patterned+fabric+inspection+using+bollinger+bandsen_HK
dc.identifier.emailPang, GKH:gpang@eee.hku.hken_HK
dc.identifier.authorityPang, GKH=rp00162en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1117/1.2345189en_HK
dc.identifier.scopuseid_2-s2.0-34547649432en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-34547649432&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume45en_HK
dc.identifier.issue8en_HK
dc.identifier.isiWOS:000241162100046-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridNgan, HYT=7102173824en_HK
dc.identifier.scopusauthoridPang, GKH=7103393283en_HK

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