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Article: Microlithography: trends, challenges, solutions, and their impact on design
Title | Microlithography: trends, challenges, solutions, and their impact on design |
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Authors | |
Keywords | Computers MICROCOMPUTERS COMPUTERS PERSONAL COMPUTERS |
Issue Date | 2003 |
Publisher | IEEE. The Journal's web site is located at http://www.computer.org/micro |
Citation | IEEE Micro, 2003, v. 23 n. 2, p. 12-21 How to Cite? |
Abstract | With lithography parameters approaching their limits, continuous improvement requires increasing dialogues and compromises between the technology and design communities. Only with such communication can semiconductor manufacturers reach the 30 nm physical-gate-length era with optical lithography. Optical lithography is an enabling technology for transistor miniaturization. With the wavelength and numerical aperture of exposure systems approaching their limits, the semiconductor industry needs continuous reduction of the k/sub 1/ factor. Challenges include image quality improvement, proximity effect correction, and cost control. An indispensable ingredient for future success is improvement in the design-manufacture interface. |
Persistent Identifier | http://hdl.handle.net/10722/44747 |
ISSN | 2023 Impact Factor: 2.8 2023 SCImago Journal Rankings: 1.145 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Wong, AK | en_HK |
dc.date.accessioned | 2007-10-30T06:09:18Z | - |
dc.date.available | 2007-10-30T06:09:18Z | - |
dc.date.issued | 2003 | en_HK |
dc.identifier.citation | IEEE Micro, 2003, v. 23 n. 2, p. 12-21 | en_HK |
dc.identifier.issn | 0272-1732 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/44747 | - |
dc.description.abstract | With lithography parameters approaching their limits, continuous improvement requires increasing dialogues and compromises between the technology and design communities. Only with such communication can semiconductor manufacturers reach the 30 nm physical-gate-length era with optical lithography. Optical lithography is an enabling technology for transistor miniaturization. With the wavelength and numerical aperture of exposure systems approaching their limits, the semiconductor industry needs continuous reduction of the k/sub 1/ factor. Challenges include image quality improvement, proximity effect correction, and cost control. An indispensable ingredient for future success is improvement in the design-manufacture interface. | en_HK |
dc.format.extent | 444928 bytes | - |
dc.format.extent | 5278 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | text/plain | - |
dc.language | eng | en_HK |
dc.publisher | IEEE. The Journal's web site is located at http://www.computer.org/micro | en_HK |
dc.relation.ispartof | IEEE Micro | - |
dc.rights | ©2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Computers | en_HK |
dc.subject | MICROCOMPUTERS COMPUTERS | en_HK |
dc.subject | PERSONAL COMPUTERS | en_HK |
dc.title | Microlithography: trends, challenges, solutions, and their impact on design | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0272-1732&volume=23&issue=2&spage=12&epage=21&date=2003&atitle=Microlithography:+trends,+challenges,+solutions,+and+their+impact+on+design | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/MM.2003.1196111 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0038294739 | - |
dc.identifier.isi | WOS:000182429200006 | - |
dc.identifier.issnl | 0272-1732 | - |