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Article: Time-resolved photoluminescence study of the stimulated emission in ZnO nanoneedles

TitleTime-resolved photoluminescence study of the stimulated emission in ZnO nanoneedles
Authors
Kwok, WMDjurišić, ABLeung, YHChan, WKPhillips, DL
KeywordsPhysics Engineering
Issue Date2005
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2005, v. 87 n. 9, article no. 093108 How to Cite?
DOI: http://dx.doi.org/10.1063/1.2035871
AbstractZnO nanoneedles were fabricated by thermal evaporation of Zn nanoparticles at 800 °C and atmospheric pressure. The samples showed strong ultraviolet photoluminescence and weak orange defect luminescence. Time-resolved photoluminescence (TRPL) was measured using the Kerr-gated fluorescence technique in order to probe the ultrafast carrier dynamics in exciton-exciton scattering and electron hole plasma (EHP) regimes. In both regimes, the decay time of the photoluminescence is very fast (∼1 ps). Even though no structure is detected in the time-integrated spectra of the EHP emission, the TRPL reveals the coexistence of the excitons and free carriers. Possible reasons for the observed phenomena are discussed. © 2005 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/44591
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID
WOS:000231503700054
References
References in Scopus

 

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dc.contributor.authorKwok, WMen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorLeung, YHen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorPhillips, DLen_HK
dc.date.accessioned2007-10-30T06:05:15Z-
dc.date.available2007-10-30T06:05:15Z-
dc.date.issued2005en_HK
dc.identifier.citationApplied Physics Letters, 2005, v. 87 n. 9, article no. 093108-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/44591-
dc.description.abstractZnO nanoneedles were fabricated by thermal evaporation of Zn nanoparticles at 800 °C and atmospheric pressure. The samples showed strong ultraviolet photoluminescence and weak orange defect luminescence. Time-resolved photoluminescence (TRPL) was measured using the Kerr-gated fluorescence technique in order to probe the ultrafast carrier dynamics in exciton-exciton scattering and electron hole plasma (EHP) regimes. In both regimes, the decay time of the photoluminescence is very fast (∼1 ps). Even though no structure is detected in the time-integrated spectra of the EHP emission, the TRPL reveals the coexistence of the excitons and free carriers. Possible reasons for the observed phenomena are discussed. © 2005 American Institute of Physics.en_HK
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dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Lettersen_HK
dc.rightsCopyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2005, v. 87 n. 9, article no. 093108 and may be found at https://doi.org/10.1063/1.2035871-
dc.subjectPhysics Engineeringen_HK
dc.titleTime-resolved photoluminescence study of the stimulated emission in ZnO nanoneedlesen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=87&issue=9&spage=093108:1&epage=3&date=2005&atitle=Time-resolved+photoluminescence+study+of+the+stimulated+emission+in+zno+nanoneedlesen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailPhillips, DL: phillips@hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityPhillips, DL=rp00770en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.2035871en_HK
dc.identifier.scopuseid_2-s2.0-24644487435en_HK
dc.identifier.hkuros105090-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-24644487435&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume87en_HK
dc.identifier.issue9en_HK
dc.identifier.spagearticle no. 093108-
dc.identifier.epagearticle no. 093108-
dc.identifier.isiWOS:000231503700054-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridKwok, WM=7103129332en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridLeung, YH=7201463866en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridPhillips, DL=7404519365en_HK
dc.identifier.issnl0003-6951-

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