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Article: Interface roughness and proximity effect on a c-axis Josephson junction between s-wave and d-wave superconductors
Title | Interface roughness and proximity effect on a c-axis Josephson junction between s-wave and d-wave superconductors |
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Authors | |
Keywords | Physics |
Issue Date | 2002 |
Publisher | American Physical Society. The Journal's web site is located at http://prb.aps.org/ |
Citation | Physical Review B (Condensed Matter), 2002, v. 65 n. 14, article no. 144527 , p. 1-6 How to Cite? |
Abstract | The scanning superconducting quantum interference device microscope on tri-crystal high-temperature superconductor (HTSC) samples unambiguously identifies the d-wave pairing symmetry as a predominant component. This fact was also seen clearly from the current phase relation (CPR) for an in-plane junction between HTSC's, where both π periodicity and 2π periodicity are observed, depending on the relative crystal orientation. However, for c-axis junctions between HTSC's and conventional superconductor, ac Josephson effect shows that the main Shapino steps occur at V=nhf/2e (n is integer) and thus a significant s-wave component is indicated. To understand the experimental measurements, we have studied interface roughness and proximity effect on CPR of such junctions. The order parameter profiles and current phase relation are computed self-consistently using the quasiclassical theory and rough interface model. Our results suggest that the existence of a minor surface s-wave component stemming from a repulsive s-channel pairing potential in the d-wave superconductor is able to give a coherent picture. |
Persistent Identifier | http://hdl.handle.net/10722/43357 |
ISSN | |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Zhang, W | en_HK |
dc.contributor.author | Wang, ZD | en_HK |
dc.date.accessioned | 2007-03-23T04:44:13Z | - |
dc.date.available | 2007-03-23T04:44:13Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | Physical Review B (Condensed Matter), 2002, v. 65 n. 14, article no. 144527 , p. 1-6 | - |
dc.identifier.issn | 0163-1829 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/43357 | - |
dc.description.abstract | The scanning superconducting quantum interference device microscope on tri-crystal high-temperature superconductor (HTSC) samples unambiguously identifies the d-wave pairing symmetry as a predominant component. This fact was also seen clearly from the current phase relation (CPR) for an in-plane junction between HTSC's, where both π periodicity and 2π periodicity are observed, depending on the relative crystal orientation. However, for c-axis junctions between HTSC's and conventional superconductor, ac Josephson effect shows that the main Shapino steps occur at V=nhf/2e (n is integer) and thus a significant s-wave component is indicated. To understand the experimental measurements, we have studied interface roughness and proximity effect on CPR of such junctions. The order parameter profiles and current phase relation are computed self-consistently using the quasiclassical theory and rough interface model. Our results suggest that the existence of a minor surface s-wave component stemming from a repulsive s-channel pairing potential in the d-wave superconductor is able to give a coherent picture. | en_HK |
dc.format.extent | 100470 bytes | - |
dc.format.extent | 45056 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/msword | - |
dc.language | eng | en_HK |
dc.publisher | American Physical Society. The Journal's web site is located at http://prb.aps.org/ | en_HK |
dc.relation.ispartof | Physical Review B (Condensed Matter) | - |
dc.rights | Copyright 2002 by The American Physical Society. This article is available online at https://doi.org/10.1103/PhysRevB.65.144527 | - |
dc.subject | Physics | en_HK |
dc.title | Interface roughness and proximity effect on a c-axis Josephson junction between s-wave and d-wave superconductors | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1098-0121&volume=65&issue=14&spage=144527:1&epage=6&date=2002&atitle=Interface+roughness+and+proximity+effect+on+a+c-axis+Josephson+junction+between+s-wave+and+d-wave+superconductors | en_HK |
dc.identifier.email | Wang, ZD: zwang@hkucc.hku.hk | en_HK |
dc.identifier.authority | Wang, ZD=rp00802 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1103/PhysRevB.65.144527 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0036538592 | en_HK |
dc.identifier.hkuros | 72595 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0036538592&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 65 | en_HK |
dc.identifier.issue | 14 | en_HK |
dc.identifier.spage | article no. 144527, p. 1 | - |
dc.identifier.epage | article no. 144527, p. 6 | - |
dc.identifier.isi | WOS:000174980300133 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Zhang, W=7409424869 | en_HK |
dc.identifier.scopusauthorid | Wang, ZD=14828459100 | en_HK |
dc.identifier.issnl | 0163-1829 | - |