File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Interface roughness and proximity effect on a c-axis Josephson junction between s-wave and d-wave superconductors

TitleInterface roughness and proximity effect on a c-axis Josephson junction between s-wave and d-wave superconductors
Authors
KeywordsPhysics
Issue Date2002
PublisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/
Citation
Physical Review B - Condensed Matter And Materials Physics, 2002, v. 65 n. 14, p. 1445271-1445276 How to Cite?
AbstractThe scanning superconducting quantum interference device microscope on tri-crystal high-temperature superconductor (HTSC) samples unambiguously identifies the d-wave pairing symmetry as a predominant component. This fact was also seen clearly from the current phase relation (CPR) for an in-plane junction between HTSC's, where both π periodicity and 2π periodicity are observed, depending on the relative crystal orientation. However, for c-axis junctions between HTSC's and conventional superconductor, ac Josephson effect shows that the main Shapino steps occur at V=nhf/2e (n is integer) and thus a significant s-wave component is indicated. To understand the experimental measurements, we have studied interface roughness and proximity effect on CPR of such junctions. The order parameter profiles and current phase relation are computed self-consistently using the quasiclassical theory and rough interface model. Our results suggest that the existence of a minor surface s-wave component stemming from a repulsive s-channel pairing potential in the d-wave superconductor is able to give a coherent picture.
Persistent Identifierhttp://hdl.handle.net/10722/43357
ISSN
2001 Impact Factor: 3.07
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorZhang, Wen_HK
dc.contributor.authorWang, ZDen_HK
dc.date.accessioned2007-03-23T04:44:13Z-
dc.date.available2007-03-23T04:44:13Z-
dc.date.issued2002en_HK
dc.identifier.citationPhysical Review B - Condensed Matter And Materials Physics, 2002, v. 65 n. 14, p. 1445271-1445276en_HK
dc.identifier.issn0163-1829en_HK
dc.identifier.urihttp://hdl.handle.net/10722/43357-
dc.description.abstractThe scanning superconducting quantum interference device microscope on tri-crystal high-temperature superconductor (HTSC) samples unambiguously identifies the d-wave pairing symmetry as a predominant component. This fact was also seen clearly from the current phase relation (CPR) for an in-plane junction between HTSC's, where both π periodicity and 2π periodicity are observed, depending on the relative crystal orientation. However, for c-axis junctions between HTSC's and conventional superconductor, ac Josephson effect shows that the main Shapino steps occur at V=nhf/2e (n is integer) and thus a significant s-wave component is indicated. To understand the experimental measurements, we have studied interface roughness and proximity effect on CPR of such junctions. The order parameter profiles and current phase relation are computed self-consistently using the quasiclassical theory and rough interface model. Our results suggest that the existence of a minor surface s-wave component stemming from a repulsive s-channel pairing potential in the d-wave superconductor is able to give a coherent picture.en_HK
dc.format.extent100470 bytes-
dc.format.extent45056 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/en_HK
dc.relation.ispartofPhysical Review B - Condensed Matter and Materials Physicsen_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsPhysical Review B (Condensed Matter and Materials Physics). Copyright © American Physical Society.en_HK
dc.subjectPhysicsen_HK
dc.titleInterface roughness and proximity effect on a c-axis Josephson junction between s-wave and d-wave superconductorsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1098-0121&volume=65&issue=14&spage=144527:1&epage=6&date=2002&atitle=Interface+roughness+and+proximity+effect+on+a+c-axis+Josephson+junction+between+s-wave+and+d-wave+superconductorsen_HK
dc.identifier.emailWang, ZD: zwang@hkucc.hku.hken_HK
dc.identifier.authorityWang, ZD=rp00802en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1103/PhysRevB.65.144527en_HK
dc.identifier.scopuseid_2-s2.0-0036538592en_HK
dc.identifier.hkuros72595-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0036538592&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume65en_HK
dc.identifier.issue14en_HK
dc.identifier.spage1445271en_HK
dc.identifier.epage1445276en_HK
dc.identifier.isiWOS:000174980300133-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridZhang, W=7409424869en_HK
dc.identifier.scopusauthoridWang, ZD=14828459100en_HK

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats